{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,10]],"date-time":"2026-03-10T13:10:53Z","timestamp":1773148253790,"version":"3.50.1"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iccad.2004.1382597","type":"proceedings-article","created":{"date-parts":[[2005,2,22]],"date-time":"2005-02-22T15:29:50Z","timestamp":1109086190000},"page":"336-342","source":"Crossref","is-referenced-by-count":68,"title":["Process and environmental variation impacts on ASIC timing"],"prefix":"10.1109","author":[{"given":"P.S.","family":"Zuchowski","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.A.","family":"Habitz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.D.","family":"Hayes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.H.","family":"Oppold","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","first-page":"331","article-title":"First-order incremental block-based statistical timing analysis","author":"visweswariah","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1145\/776063.776066"},{"key":"11","article-title":"Increasing circuit performance through statistical design techniques","author":"orshansky","year":"2003","journal-title":"Closing the Gap between ASIC & Custom"},{"key":"12","year":"0","journal-title":"1481-1999 IEEE Standard for Integrated Circuit (IC) Delay and Power Calculation System"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1998.746355"},{"key":"2","year":"2001","journal-title":"International Technology Roadmap for Semiconductors"},{"key":"1","article-title":"Models of process variations in device and interconnect","author":"boning","year":"2000","journal-title":"Design of High-Performance Microprocessor Circuits"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1997.650512"},{"key":"7","article-title":"Optical lithography to 2000 and beyond","author":"burggraaf","year":"1999","journal-title":"Solid State Technology"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1117\/12.250826"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1117\/12.389050"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1995.499247"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.1994.324400"},{"key":"8","article-title":"The application of alternating phase-shifting masks to 140nm gate patterning: Line width control improvements and design optimization","author":"liu","year":"1998","journal-title":"Proc of SPIE 17th Annual BACUS Symposium on Photomask Technologies"}],"event":{"name":"ICCAD 2004. International Conference on Computer Aided Design","location":"San Jose, CA, USA","acronym":"ICCAD-04"},"container-title":["IEEE\/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9494\/30133\/01382597.pdf?arnumber=1382597","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T20:47:16Z","timestamp":1489524436000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1382597\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iccad.2004.1382597","relation":{},"subject":[]}}