{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:43:01Z","timestamp":1749620581050},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,11]]},"DOI":"10.1109\/iccad.2007.4397299","type":"proceedings-article","created":{"date-parts":[[2008,1,9]],"date-time":"2008-01-09T14:22:47Z","timestamp":1199888567000},"page":"405-412","source":"Crossref","is-referenced-by-count":11,"title":["Variation-aware performance verification using at-speed structural test and statistical timing"],"prefix":"10.1109","author":[{"family":"Vikram Iyengar","sequence":"first","affiliation":[]},{"family":"Jinjun Xiong","sequence":"additional","affiliation":[]},{"family":"Subbayyan Venkatesan","sequence":"additional","affiliation":[]},{"given":"Vladimir","family":"Zolotov","sequence":"additional","affiliation":[]},{"given":"David","family":"Lackey","sequence":"additional","affiliation":[]},{"given":"Peter","family":"Ha","sequence":"additional","affiliation":[]},{"given":"Chandu","family":"Visweswariah","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041808"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041853"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2004.1337547"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862751"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065607"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/776063.776066"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146929"},{"key":"ref17","first-page":"71","article-title":"Parameterized block-based statistical timing analysis with non-Gaussian and nonlinear parameters","author":"chang","year":"2005","journal-title":"Proc Design Automation Conf"},{"year":"0","key":"ref18"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.835137"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583968"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1232254"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2000.855293"},{"key":"ref8","first-page":"37","article-title":"A statistical fault coverage metric for realistic path delay faults","author":"qiu","year":"2004","journal-title":"Proc VLSI Test Symp"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386956"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297686"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382597"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012689"}],"event":{"name":"2007 IEEE\/ACM International Conference on Computer-Aided Design","start":{"date-parts":[[2007,11,4]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2007,11,8]]}},"container-title":["2007 IEEE\/ACM International Conference on Computer-Aided Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4397222\/4397223\/04397299.pdf?arnumber=4397299","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T15:52:44Z","timestamp":1489679564000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4397299\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,11]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iccad.2007.4397299","relation":{},"ISSN":["1092-3152"],"issn-type":[{"type":"print","value":"1092-3152"}],"subject":[],"published":{"date-parts":[[2007,11]]}}}