{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T12:02:00Z","timestamp":1759147320137},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,11]]},"DOI":"10.1109\/iccad.2007.4397348","type":"proceedings-article","created":{"date-parts":[[2008,1,9]],"date-time":"2008-01-09T14:22:47Z","timestamp":1199888567000},"page":"705-712","source":"Crossref","is-referenced-by-count":7,"title":["Compact modeling of variational waveforms"],"prefix":"10.1109","author":[{"given":"V.","family":"Zolotov","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Xiong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Abbaspour","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D. J.","family":"Hathaway","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Visweswariah","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775933"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2002.996783"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.712097"},{"key":"ref13","first-page":"363","article-title":"A waveform independent gate model for accurate timing analsis","author":"li","year":"2005","journal-title":"ICCAD"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1975.1083997"},{"key":"ref15","first-page":"54","article-title":"Practical variation-aware interconnect delay and slew analysis for statistical timin verification","author":"ye","year":"2006","journal-title":"ICCAD"},{"article-title":"Electronic circuit and system simulation methods","year":"1995","author":"pillage","key":"ref16"},{"key":"ref17","first-page":"247","article-title":"A multi-port current source model for multiple-input switching effects in CMOS library cells","author":"amin","year":"2006","journal-title":"DAC"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.282"},{"key":"ref19","first-page":"645","article-title":"Variational analysis of large power grids by exploring statistical sampling sharing and spatial locality","author":"li","year":"2005","journal-title":"ICCAD"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2005.1560198"},{"key":"ref3","first-page":"71","article-title":"Parameterized statistical timing analysis with non-Gaussian and nonlinear parameters","author":"chang","year":"2005","journal-title":"DAC"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/EIT.2005.1626972"},{"key":"ref5","first-page":"52","article-title":"Advanced waveform models for the nanometer regime","author":"nassif","year":"2004","journal-title":"TAU"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/288548.288555"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159686"},{"key":"ref2","first-page":"331","article-title":"First-order incremental block-based statistical timing analysis","author":"visweswariah","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"ref1","first-page":"62","article-title":"Statistical timing analysis with uncertainty","author":"agarwal","year":"2003","journal-title":"DATE"},{"key":"ref9","first-page":"253","article-title":"Statistical logic cell delay analysis using a current-based model","author":"fatemi","year":"2006","journal-title":"DAC"}],"event":{"name":"2007 IEEE\/ACM International Conference on Computer-Aided Design","start":{"date-parts":[[2007,11,4]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2007,11,8]]}},"container-title":["2007 IEEE\/ACM International Conference on Computer-Aided Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4397222\/4397223\/04397348.pdf?arnumber=4397348","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T12:02:54Z","timestamp":1489665774000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4397348\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,11]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iccad.2007.4397348","relation":{},"ISSN":["1092-3152"],"issn-type":[{"type":"print","value":"1092-3152"}],"subject":[],"published":{"date-parts":[[2007,11]]}}}