{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:55:01Z","timestamp":1759146901426},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/iccad.2010.5654159","type":"proceedings-article","created":{"date-parts":[[2010,12,10]],"date-time":"2010-12-10T22:29:13Z","timestamp":1292020153000},"page":"248-251","source":"Crossref","is-referenced-by-count":8,"title":["Design automation towards reliable analog integrated circuits"],"prefix":"10.1109","author":[{"given":"Georges","family":"Gielen","sequence":"first","affiliation":[]},{"given":"Elie","family":"Maricau","sequence":"additional","affiliation":[]},{"given":"Pieter","family":"De Wit","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1049\/el:20071584"},{"journal-title":"EMC Tutorial","year":"2004","author":"casier","key":"17"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1049\/el:19940195"},{"key":"15","article-title":"Universal recovery behavior of negative bias temperature instability","author":"mielke","year":"2003","journal-title":"Proc IEDM"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1049\/el.2010.1971"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.08.001"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197745"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1985.21952"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2062870"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2006.33"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090853"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484862"},{"journal-title":"Technology Roadmap","year":"2009","key":"1"},{"journal-title":"Compact Modeling and Simulation of Circuit Reliability for 65nm CMOS Technology","year":"2007","author":"wang","key":"10"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.04.004"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2007.01.035"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(02)00026-4"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/7298.946459"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/16.293309"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763206"}],"event":{"name":"2010 IEEE\/ACM International Conference on Computer-Aided Design (ICCAD)","start":{"date-parts":[[2010,11,7]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2010,11,11]]}},"container-title":["2010 IEEE\/ACM International Conference on Computer-Aided Design (ICCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5638200\/5648785\/05654159.pdf?arnumber=5654159","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T04:10:45Z","timestamp":1490069445000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5654159\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/iccad.2010.5654159","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}