{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,30]],"date-time":"2025-10-30T22:28:13Z","timestamp":1761863293687},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,11]]},"DOI":"10.1109\/iccad.2013.6691147","type":"proceedings-article","created":{"date-parts":[[2014,3,7]],"date-time":"2014-03-07T17:22:41Z","timestamp":1394212961000},"page":"387-392","source":"Crossref","is-referenced-by-count":4,"title":["Scalable and efficient analog parametric fault identification"],"prefix":"10.1109","author":[{"given":"Mustafa","family":"Berke Yelten","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Suriyaprakash","family":"Natarajan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bin","family":"Xue","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Prashant","family":"Goteti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139178"},{"key":"13","article-title":"Efficient simulation of parametric faults for multi-stage analog circuits","author":"liu","year":"2007","journal-title":"Int Test Conf"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654259"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024769"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228544"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840855"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2012.6187561"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2012.6165064"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2185931"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766670"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.818541"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.528008"},{"key":"4","article-title":"Parametric faults detection in analog circuits using polynomial coefficients in NN learning","author":"kuczynski","year":"2010","journal-title":"IEEE Int Conf on Signals and Electronic Systems"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2020721"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2201759"}],"event":{"name":"2013 IEEE\/ACM International Conference on Computer-Aided Design (ICCAD)","start":{"date-parts":[[2013,11,18]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2013,11,21]]}},"container-title":["2013 IEEE\/ACM International Conference on Computer-Aided Design (ICCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6679730\/6691081\/06691147.pdf?arnumber=6691147","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T20:56:35Z","timestamp":1490216195000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6691147\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,11]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iccad.2013.6691147","relation":{},"subject":[],"published":{"date-parts":[[2013,11]]}}}