{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T00:07:22Z","timestamp":1773965242783,"version":"3.50.1"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,11]]},"DOI":"10.1109\/iccad.2015.7372584","type":"proceedings-article","created":{"date-parts":[[2016,1,7]],"date-time":"2016-01-07T22:15:52Z","timestamp":1452204952000},"page":"300-306","source":"Crossref","is-referenced-by-count":3,"title":["Pairwise proximity-based features for test escape screening"],"prefix":"10.1109","author":[{"given":"Fan","family":"Lin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chun-Kai","family":"Hsu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alberto Giovanni","family":"Busetto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kwang-Ting","family":"Cheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583988"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342391"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.1998.710815"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035344"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2003.1251147"},{"key":"ref15","first-page":"327","article-title":"Advances in kernel methods","author":"sch\u00f6lkopf","year":"1999"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/342009.335388"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/BF00994018"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1961189.1961199"},{"key":"ref19","author":"duda","year":"2000","journal-title":"Pattern Classification"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401547"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700549"},{"key":"ref6","article-title":"Variance reduction using wafer patterns in IddQ data","author":"daasch","year":"2000","journal-title":"Proc Int Test Conf (ITC)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2206552"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041819"},{"key":"ref7","doi-asserted-by":"crossref","DOI":"10.1109\/TEST.2001.966622","article-title":"Neighbor selection for variance reduction in IDDQ and other parametric data","author":"daasch","year":"2001","journal-title":"Proc Int'l Test Conf (ITC)"},{"key":"ref2","article-title":"Guidelines for testing","year":"2011","journal-title":"Automotive Electronics Council"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437700"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011113"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1983.10487848"},{"key":"ref22","first-page":"49","article-title":"On the generalised distance in statistics","author":"mahalanobis","year":"1936","journal-title":"Proc Nat Inst Sci India"},{"key":"ref21","article-title":"e-handbnok of statistical methods","year":"2003","journal-title":"NIST\/SEMATECH"}],"event":{"name":"2015 IEEE\/ACM International Conference on Computer-Aided Design (ICCAD)","location":"Austin, TX, USA","start":{"date-parts":[[2015,11,2]]},"end":{"date-parts":[[2015,11,6]]}},"container-title":["2015 IEEE\/ACM International Conference on Computer-Aided Design (ICCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7367889\/7372533\/07372584.pdf?arnumber=7372584","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T03:15:29Z","timestamp":1498274129000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7372584\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/iccad.2015.7372584","relation":{},"subject":[],"published":{"date-parts":[[2015,11]]}}}