{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,5]],"date-time":"2025-06-05T23:25:33Z","timestamp":1749165933905,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,11]]},"DOI":"10.1109\/iccad.2017.8203857","type":"proceedings-article","created":{"date-parts":[[2017,12,14]],"date-time":"2017-12-14T17:02:04Z","timestamp":1513270924000},"page":"786-793","source":"Crossref","is-referenced-by-count":19,"title":["Online and incremental machine learning approaches for IC yield improvement"],"prefix":"10.1109","author":[{"given":"Hongge","family":"Chen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Duane","family":"Boning","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2009.2029559"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2967032"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2016.2609424"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICSMC.2005.1571498"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s13748-011-0008-0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2012.136"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/21.97458"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1273496.1273614"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"429","DOI":"10.3233\/IDA-2002-6504","article-title":"The class imbalance problem: A systematic study","volume":"6","author":"japkowicz","year":"2002","journal-title":"Intelligent Data Analysis"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2487575.2488192"},{"key":"ref6","article-title":"Wafer defect prediction with statistical machine learning","author":"arnold","year":"2016","journal-title":"Massachusetts Institute of Technology"},{"key":"ref5","article-title":"The problem of concept drift: definitions and related work","volume":"106","author":"tsymbal","year":"2004","journal-title":"Technical Report"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2008.239"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1142\/S0218001409007326"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/00207540050205073"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/6104.924792"},{"key":"ref9","first-page":"148","article-title":"Experiments with a new boosting algorithm","volume":"96","author":"freund","year":"1996","journal-title":"ICML"}],"event":{"name":"2017 IEEE\/ACM International Conference on Computer-Aided Design (ICCAD)","start":{"date-parts":[[2017,11,13]]},"location":"Irvine, CA","end":{"date-parts":[[2017,11,16]]}},"container-title":["2017 IEEE\/ACM International Conference on Computer-Aided Design (ICCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8167715\/8203744\/08203857.pdf?arnumber=8203857","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,7]],"date-time":"2019-10-07T21:35:29Z","timestamp":1570484129000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8203857\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,11]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/iccad.2017.8203857","relation":{},"subject":[],"published":{"date-parts":[[2017,11]]}}}