{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,21]],"date-time":"2026-01-21T18:06:39Z","timestamp":1769018799806,"version":"3.49.0"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,28]],"date-time":"2023-10-28T00:00:00Z","timestamp":1698451200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,28]],"date-time":"2023-10-28T00:00:00Z","timestamp":1698451200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"NSFC","doi-asserted-by":"publisher","award":["62125401,T2293700,T2293704"],"award-info":[{"award-number":["62125401,T2293700,T2293704"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013314","name":"111 Project","doi-asserted-by":"publisher","award":["B18001"],"award-info":[{"award-number":["B18001"]}],"id":[{"id":"10.13039\/501100013314","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,28]]},"DOI":"10.1109\/iccad57390.2023.10323816","type":"proceedings-article","created":{"date-parts":[[2023,11,30]],"date-time":"2023-11-30T18:58:45Z","timestamp":1701370725000},"page":"1-9","source":"Crossref","is-referenced-by-count":3,"title":["READ: Reliability-Enhanced Accelerator Dataflow Optimization Using Critical Input Pattern Reduction"],"prefix":"10.1109","author":[{"given":"Zuodong","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Integrated Circuits, Peking University,Beijing,China"}]},{"given":"Renjie","family":"Wei","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Peking University,Beijing,China"}]},{"given":"Meng","family":"Li","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Peking University,Beijing,China"}]},{"given":"Yibo","family":"Lin","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Peking University,Beijing,China"}]},{"given":"Runsheng","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Peking University,Beijing,China"}]},{"given":"Ru","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Peking University,Beijing,China"}]}],"member":"263","reference":[{"key":"ref1","article-title":"Robustart: Benchmarking robustness on architecture design and training techniques","author":"Tang","year":"2021","journal-title":"arXiv preprint"},{"key":"ref2","article-title":"Fault-tolerant deep learning: A hierarchical perspective","author":"Liu","year":"2022","journal-title":"arXiv preprint"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3458336.3465297"},{"key":"ref4","article-title":"Silent data corruptions at scale","author":"Dixit","year":"2021","journal-title":"arXiv preprint"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2020.2971217"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2841824"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2018.8465918"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203882"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3106858"},{"key":"ref10","first-page":"1","article-title":"Greentpu: Improving timing error resilience of a near-threshold tensor processing unit","volume-title":"ACM\/IEEE Design Automation Conference (DAC)","author":"Pandey"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPDS.2020.3043449"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3119511"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714885"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2884460"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC47756.2020.9045479"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3027953"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/2749469.2750389"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2616357"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3079856.3080246"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2761740"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2018.8465834"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268378"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"ref24","first-page":"13316","article-title":"Channel permutations for n:m sparsity","volume":"34","author":"Pool","year":"2021","journal-title":"Advances in Neural Information Processing Systems"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/2717764.2717783"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/3489517.3530530"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203856"}],"event":{"name":"2023 IEEE\/ACM International Conference on Computer Aided Design (ICCAD)","location":"San Francisco, CA, USA","start":{"date-parts":[[2023,10,28]]},"end":{"date-parts":[[2023,11,2]]}},"container-title":["2023 IEEE\/ACM International Conference on Computer Aided Design (ICCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10323590\/10323543\/10323816.pdf?arnumber=10323816","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,9]],"date-time":"2024-10-09T17:43:12Z","timestamp":1728495792000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10323816\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,28]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/iccad57390.2023.10323816","relation":{},"subject":[],"published":{"date-parts":[[2023,10,28]]}}}