{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T05:50:39Z","timestamp":1763704239779,"version":"3.45.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T00:00:00Z","timestamp":1761436800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T00:00:00Z","timestamp":1761436800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006190","name":"Research and Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006190","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,26]]},"DOI":"10.1109\/iccad66269.2025.11240641","type":"proceedings-article","created":{"date-parts":[[2025,11,20]],"date-time":"2025-11-20T18:39:34Z","timestamp":1763663974000},"page":"1-8","source":"Crossref","is-referenced-by-count":0,"title":["CorDBA: Corners Decoupled Bayesian Approach for yield optimization"],"prefix":"10.1109","author":[{"given":"Yue","family":"Zhang","sequence":"first","affiliation":[{"name":"Beihang University,School of Integrated Circuit Science and Engineering"}]},{"given":"Yunqi","family":"Li","sequence":"additional","affiliation":[{"name":"Beihang University,School of Integrated Circuit Science and Engineering"}]},{"given":"Shichang","family":"Ye","sequence":"additional","affiliation":[{"name":"Beihang University,School of Integrated Circuit Science and Engineering"}]},{"given":"Bojun","family":"Zhang","sequence":"additional","affiliation":[{"name":"Beihang University,School of Integrated Circuit Science and Engineering"}]},{"given":"Jinkai","family":"Wang","sequence":"additional","affiliation":[{"name":"Beihang University,School of Integrated Circuit Science and Engineering"}]},{"given":"Zhizhong","family":"Zhang","sequence":"additional","affiliation":[{"name":"Beihang University,School of Integrated Circuit Science and Engineering"}]},{"given":"Peng","family":"Wang","sequence":"additional","affiliation":[{"name":"SICSE, Beihang University,LMIB, Ministry of Education, Zhengzhou Aerotropolis Institute of Artificial Intelligence"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2106850"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2778061"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2012.2231429"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456940"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681573"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1987.10488205"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcp.2010.08.022"},{"key":"ref8","first-page":"1","article-title":"Meta-model based high-dimensional yield analysis using low-rank tensor approximation","volume-title":"Proceedings of the 56th Annual Design Automation Conference 2019","author":"Shi"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2336851"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3489517.3530607"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DAC56929.2023.10247952"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691110"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3054811"},{"volume-title":"Variation-aware design of custom integrated circuits: a hands-on field guide","year":"2012","author":"McConaghy","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.912191"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1115\/1.3653121"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3582078"},{"key":"ref18","first-page":"1","article-title":"Tso-flow: A topology synthesis and optimization workflow for operational amplifiers with invertible graph generative model","volume-title":"Proceedings of the 43rd IEEE\/ACM International Conference on Computer-Aided Design","author":"Han"}],"event":{"name":"2025 IEEE\/ACM International Conference On Computer Aided Design (ICCAD)","start":{"date-parts":[[2025,10,26]]},"location":"Munich, Germany","end":{"date-parts":[[2025,10,30]]}},"container-title":["2025 IEEE\/ACM International Conference On Computer Aided Design (ICCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11240608\/11240621\/11240641.pdf?arnumber=11240641","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T05:42:20Z","timestamp":1763703740000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11240641\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,26]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iccad66269.2025.11240641","relation":{},"subject":[],"published":{"date-parts":[[2025,10,26]]}}}