{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T00:08:33Z","timestamp":1780445313786,"version":"3.54.1"},"reference-count":44,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T00:00:00Z","timestamp":1761436800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T00:00:00Z","timestamp":1761436800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006190","name":"Research and Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006190","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100008081","name":"Southeast University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100008081","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,26]]},"DOI":"10.1109\/iccad66269.2025.11240679","type":"proceedings-article","created":{"date-parts":[[2025,11,20]],"date-time":"2025-11-20T18:39:34Z","timestamp":1763663974000},"page":"1-9","source":"Crossref","is-referenced-by-count":2,"title":["From Concept to Practice: an Automated LLM-aided UVM Machine for RTL Verification"],"prefix":"10.1109","author":[{"given":"Junhao","family":"Ye","sequence":"first","affiliation":[{"name":"Southeast University,School of Integrated Circuits,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuchen","family":"Hu","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ke","family":"Xu","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Dingrong","family":"Pan","sequence":"additional","affiliation":[{"name":"National Center of Technology Innovation for EDA,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qichun","family":"Chen","sequence":"additional","affiliation":[{"name":"Shenzhen University,College of Economics,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jie","family":"Zhou","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shuai","family":"Zhao","sequence":"additional","affiliation":[{"name":"Sun Yat-sen University,School of Computer Science and Engineering,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xinwei","family":"Fang","sequence":"additional","affiliation":[{"name":"University of York,Department of Computer Science,UK"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xi","family":"Wang","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nan","family":"Guan","sequence":"additional","affiliation":[{"name":"City University of Hong Kong,Department of Computer Science,Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhe","family":"Jiang","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2834439"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2019.8697608"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/NILES53778.2021.9600502"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/app12031559"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-13074-8_14"},{"key":"ref6","volume-title":"Computer architecture: a quantitative approach.","author":"Hennessy","year":"2011"},{"key":"ref7","volume-title":"Digital Design and Computer Architecture, RISC-V Edition.","author":"Harris","year":"2021"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2014.7038594"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICACEA.2015.7164768"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICACCI.2018.8554919"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC.2011.6138671"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2014.6841904"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD.2017.8093248"},{"key":"ref14","first-page":"24","article-title":"Portable stimulus driven systemverilog\/uvm verification environment for the verification of a high-capacity ethemet communication endpoint","volume-title":"Proceedings of the 2018 DVCON Conference and Exhibition Europe, Munich, Germany","author":"Vintila"},{"key":"ref15","first-page":"1","article-title":"If systemverilog is so good, why do we need the uvm? sharing responsibilities between libraries and the core language","volume-title":"Proceedings of the 2013 Forum on specification and Design Languages (FDL)","author":"Bromley"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/EAMTA.2014.6906085"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LATS65346.2025.10963962"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TAPENERGY.2017.8397323"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICAECIS58353.2023.10170273"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CISCON62171.2024.10696231"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MTV.2013.16"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ASID60355.2023.10426039"},{"issue":"6","key":"ref23","first-page":"20","article-title":"Uvm methodology: Industry-specific applications in modem hardware verification","volume":"15","author":"Reddy","year":"2024","journal-title":"International Journal of Computer Engineering and Technology (IJCET)"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/3643681"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MLCAD58807.2023.10299874"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/3649329.3657353"},{"key":"ref27","article-title":"Fixing hardware security bugs with large language models","author":"Ahmad","year":"2023"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST59942.2023.10409307"},{"key":"ref29","article-title":"Make every move count: Llm-based high-quality rtl code generation using mcts","author":"DeLorenzo","year":"2024"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/VTS60656.2024.10538589"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/3735638"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/LAD62341.2024.10691792"},{"key":"ref33","article-title":"Location is key: Leveraging large language model for functional bug localization in verilog","author":"Yao","year":"2024"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/DAC63849.2025.11133324"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/3676536.3676801"},{"key":"ref36","article-title":"Uvllm: An automated universal rtl verification framework using 11ms","author":"Hu","year":"2024"},{"key":"ref37","article-title":"A prompt pattern catalog to enhance prompt engineering with chatgpt","author":"White","year":"2023"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD57390.2023.10323812"},{"key":"ref39","article-title":"Chipgpt: How far are we from natural language hardware design","author":"Chang","year":"2023"},{"key":"ref40","article-title":"A systematic survey of prompt engineering in large language models: Techniques and applications","author":"Sahoo","year":"2024"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/MIPRO60963.2024.10569238"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/eStream61684.2024.10542617"},{"key":"ref43","article-title":"A comprehensive survey of hallucination mitigation techniques in large language models","author":"Tonmoy","year":"2024"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/asp-dac58780.2024.10473904"}],"event":{"name":"2025 IEEE\/ACM International Conference On Computer Aided Design (ICCAD)","location":"Munich, Germany","start":{"date-parts":[[2025,10,26]]},"end":{"date-parts":[[2025,10,30]]}},"container-title":["2025 IEEE\/ACM International Conference On Computer Aided Design (ICCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11240608\/11240621\/11240679.pdf?arnumber=11240679","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T19:47:55Z","timestamp":1774986475000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11240679\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,26]]},"references-count":44,"URL":"https:\/\/doi.org\/10.1109\/iccad66269.2025.11240679","relation":{},"subject":[],"published":{"date-parts":[[2025,10,26]]}}}