{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T18:44:27Z","timestamp":1763750667937,"version":"3.45.0"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T00:00:00Z","timestamp":1761436800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T00:00:00Z","timestamp":1761436800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001691","name":"Japan Society for the Promotion of Science","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,26]]},"DOI":"10.1109\/iccad66269.2025.11240869","type":"proceedings-article","created":{"date-parts":[[2025,11,20]],"date-time":"2025-11-20T18:39:34Z","timestamp":1763663974000},"page":"1-9","source":"Crossref","is-referenced-by-count":0,"title":["Tenpura: A General Transient Fault Evaluation and Scope Narrowing Platform for Ultra-fast Reliability Analysis"],"prefix":"10.1109","author":[{"given":"Quan","family":"Cheng","sequence":"first","affiliation":[{"name":"Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan"}]},{"given":"Huizi","family":"Zhang","sequence":"additional","affiliation":[{"name":"Southern University of Science and Technology,School of Microelectronics,Shenzhen,China"}]},{"given":"Chien-Hsing","family":"Liang","sequence":"additional","affiliation":[{"name":"National Tsing Hua University,Department of Electrical Engineering,Hsinchu,Taiwan"}]},{"given":"Mingtao","family":"Zhang","sequence":"additional","affiliation":[{"name":"Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan"}]},{"given":"Jing-jia","family":"Liou","sequence":"additional","affiliation":[{"name":"National Tsing Hua University,Department of Electrical Engineering,Hsinchu,Taiwan"}]},{"given":"Jinjun","family":"Xiong","sequence":"additional","affiliation":[{"name":"University at Buffalo,Department of Computer Science and Engineering,USA"}]},{"given":"Longyang","family":"Lin","sequence":"additional","affiliation":[{"name":"Southern University of Science and Technology,School of Microelectronics,Shenzhen,China"}]},{"given":"Masanori","family":"Hashimoto","sequence":"additional","affiliation":[{"name":"Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2024.3349956"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2024.103242"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/hpca.2005.37"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/taes.2024.3393929"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2023.3300899"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/itc50571.2021.00008"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3649329.3656537"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2022.3184274"},{"key":"ref9","first-page":"449","article-title":"Security of Neural Networks from Hardware Perspective: A Survey and Beyond","volume-title":"2021 26th Asia and South Pacific Design Automation Conference (ASP-DAC)","author":"Xu"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS55109.2022.00027"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/issrew55968.2022.00074"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/icmla51294.2020.00183"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.23919\/date64628.2025.10993139"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2830772.2830829"},{"key":"ref15","first-page":"1","article-title":"Quantitative evaluation of soft error injection techniques for robust system design","volume-title":"2013 50th ACM\/EDAC\/IEEE Design Automation Conference (DAC)","author":"Cho"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ats56056.2022.00037"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/l-ca.2007.19"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/11408901_19"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/socc.2012.6398361"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ftcs.1995.466978"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/eiecs59936.2023.10435587"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2023.3323165"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/emc249363.2019.00012"}],"event":{"name":"2025 IEEE\/ACM International Conference On Computer Aided Design (ICCAD)","start":{"date-parts":[[2025,10,26]]},"location":"Munich, Germany","end":{"date-parts":[[2025,10,30]]}},"container-title":["2025 IEEE\/ACM International Conference On Computer Aided Design (ICCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11240608\/11240621\/11240869.pdf?arnumber=11240869","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T18:39:40Z","timestamp":1763750380000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11240869\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,26]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/iccad66269.2025.11240869","relation":{},"subject":[],"published":{"date-parts":[[2025,10,26]]}}}