{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T18:44:27Z","timestamp":1763750667090,"version":"3.45.0"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T00:00:00Z","timestamp":1761436800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T00:00:00Z","timestamp":1761436800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,26]]},"DOI":"10.1109\/iccad66269.2025.11240915","type":"proceedings-article","created":{"date-parts":[[2025,11,20]],"date-time":"2025-11-20T18:39:34Z","timestamp":1763663974000},"page":"1-9","source":"Crossref","is-referenced-by-count":0,"title":["Invited Paper: CURE-Fuzz: Curiosity-Driven Reinforcement Learning for Agile Hardware Testing"],"prefix":"10.1109","author":[{"given":"Hanwei","family":"Fan","sequence":"first","affiliation":[{"name":"The Hong Kong University of Science and Technology"}]},{"given":"Ya","family":"Wang","sequence":"additional","affiliation":[{"name":"The Hong Kong University of Science and Technology"}]},{"given":"Xiaofeng","family":"Zhou","sequence":"additional","affiliation":[{"name":"The Hong Kong University of Science and Technology"}]},{"given":"Sicheng","family":"Li","sequence":"additional","affiliation":[{"name":"Damo Academy & Hupan Lab, Alibaba"}]},{"given":"Binguang","family":"Zhao","sequence":"additional","affiliation":[{"name":"Damo Academy & Hupan Lab, Alibaba"}]},{"given":"Yangdi","family":"Lyu","sequence":"additional","affiliation":[{"name":"The Hong Kong University of Science and Technology (Guangzhou)"}]},{"given":"Jiang","family":"Xu","sequence":"additional","affiliation":[{"name":"The Hong Kong University of Science and Technology (Guangzhou)"}]},{"given":"Wei","family":"Zhang","sequence":"additional","affiliation":[{"name":"The Hong Kong University of Science and Technology"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/MICRO.2006.41"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1007\/978-3-642-35746-6_1"},{"key":"ref3","first-page":"213","article-title":"{HardFails}: insights into {software-exploitable} hardware bugs","volume-title":"28th USENIX Security Symposium (USENIX Security 19)","author":"Dessouky"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/CEC.2001.934425"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1145\/2694344.2694366"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1145\/3240765.3240842"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/SP40001.2021.00103"},{"key":"ref8","first-page":"3237","article-title":"Fuzzing hardware like software","volume-title":"31st USENIX Security Symposium (USENIX Security 22)","author":"Trippel"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/HOST55118.2023.10133714"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1145\/2228360.2228584"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/MM.2020.2996616"},{"key":"ref12","first-page":"5341","article-title":"Cascade:{CPU} fuzzing via intricate program generation","volume-title":"33rd USENIX Security Symposium (USENIX Security 24)","author":"Solt"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.23919\/DATE64628.2025.10993080"},{"author":"Wu","journal-title":"Genhuzz: An efficient generative hardware fuzzer","key":"ref14"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/ISCAS51556.2021.9401267"},{"key":"ref16","first-page":"3219","article-title":"{TheHuzz}: Instruction fuzzing of processors using {Golden-Reference} models for finding {Software-Exploitable} vulnerabilities","volume-title":"31st USENIX Security Symposium (USENIX Security 22)","author":"Kande"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1162\/neco.1997.9.8.1735"},{"key":"ref18","article-title":"Improving language understanding with unsupervised learning","author":"Radford","year":"2018","journal-title":"OpenAI Res"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.12794\/metadc1505267"},{"year":"2021","article-title":"Verilator: The Fastest Verilog\/SystemVerilog Simulator","key":"ref20"},{"year":"2018","author":"Burda","article-title":"Exploration by random network distillation","key":"ref21"},{"year":"2015","author":"Schulman","article-title":"Highdimensional continuous control using generalized advantage estimation","key":"ref22"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1137\/070709359"},{"key":"ref24","first-page":"6","article-title":"The rocket chip generator","volume":"4","author":"Asanovic","year":"2016","journal-title":"EECS Department, University of California, Berkeley, Tech. Rep. UCB\/EECS-2016-17"},{"key":"ref25","article-title":"The berkeley out-of-order machine (boom): An industry-competitive, synthesizable, parameterized risc-v processor","author":"Asanovic","year":"2015","journal-title":"Tech. Rep."},{"year":"2024","article-title":"Verilator: The Fastest Verilog\/SystemVerilog Simulator","key":"ref26"},{"volume-title":"34th USENIX Security","author":"B\u00f6lcskei","article-title":"Encarsia: Evaluating cpu fuzzers via automatic bug injection","key":"ref27"}],"event":{"name":"2025 IEEE\/ACM International Conference On Computer Aided Design (ICCAD)","start":{"date-parts":[[2025,10,26]]},"location":"Munich, Germany","end":{"date-parts":[[2025,10,30]]}},"container-title":["2025 IEEE\/ACM International Conference On Computer Aided Design (ICCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11240608\/11240621\/11240915.pdf?arnumber=11240915","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T18:39:40Z","timestamp":1763750380000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11240915\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,26]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/iccad66269.2025.11240915","relation":{},"subject":[],"published":{"date-parts":[[2025,10,26]]}}}