{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,30]],"date-time":"2026-06-30T20:58:25Z","timestamp":1782853105031,"version":"3.54.5"},"reference-count":32,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T00:00:00Z","timestamp":1761436800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T00:00:00Z","timestamp":1761436800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006190","name":"Research and Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006190","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,26]]},"DOI":"10.1109\/iccad66269.2025.11240990","type":"proceedings-article","created":{"date-parts":[[2025,11,20]],"date-time":"2025-11-20T18:39:34Z","timestamp":1763663974000},"page":"1-8","source":"Crossref","is-referenced-by-count":0,"title":["RSizing: Robust Bayesian Optimization for Analog Circuit Sizing Under Process Variations"],"prefix":"10.1109","author":[{"given":"Jindong","family":"Tu","sequence":"first","affiliation":[{"name":"The Chinese University of Hong Kong,Shenzhen"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yapeng","family":"Li","sequence":"additional","affiliation":[{"name":"The Chinese University of Hong Kong,Shenzhen"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Peng","family":"Xu","sequence":"additional","affiliation":[{"name":"The Chinese University of Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tuo","family":"Li","sequence":"additional","affiliation":[{"name":"Shandong Yunhai Guochuang Cloud Computing Equipment Industry Innovation Co., Lt"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Guoqing","family":"Li","sequence":"additional","affiliation":[{"name":"Shandong Yunhai Guochuang Cloud Computing Equipment Industry Innovation Co., Lt"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zushuai","family":"Xie","sequence":"additional","affiliation":[{"name":"Nanjing University of Posts and Telecommunications"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bei","family":"Yu","sequence":"additional","affiliation":[{"name":"The Chinese University of Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tinghuan","family":"Chen","sequence":"additional","affiliation":[{"name":"The Chinese University of Hong Kong,Shenzhen"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Analysis and design of analog integrated circuits.","author":"Gray","year":"2024"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2021.3054811"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2022.3221694"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2001.968645"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2021.3120547"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18074.2021.9586139"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2106850"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/4235.996017"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2017.2778061"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2021.3064440"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3489517.3530514"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998359"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD57390.2023.10323689"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/mlcad55463.2022.9900079"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3649329.3661850"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DAC56929.2023.10247991"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2024.3435692"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD57390.2023.10323899"},{"key":"ref19","first-page":"4831","article-title":"Robust multi-objective Bayesian optimization under input noise","volume-title":"Proc. ICML","author":"Daulton"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2015.2494218"},{"key":"ref21","article-title":"Scalable global optimization via local Bayesian optimization","volume-title":"Proc. NIPS","volume":"32","author":"Eriksson"},{"key":"ref22","first-page":"507","article-title":"Multi-objective bayesian optimization over high-dimensional search spaces","volume-title":"Proc. UAI","author":"Daulton"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.7551\/mitpress\/3206.001.0001"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2009.09.001"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/3195970.3196078"},{"key":"ref26","article-title":"Regression with input-dependent noise: A Gaussian process treatment","volume-title":"Proc. NIPS","volume":"10","author":"Goldberg"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/1273496.1273546"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s10479-010-0790-2"},{"key":"ref29","article-title":"An empirical evaluation of thompson sampling","volume-title":"Proc. NIPS","volume":"24","author":"Chapelle"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242079"},{"key":"ref31","article-title":"Empyrean PyAether: Unified data ecosystem for full-custom circuit design","volume-title":"Technical Documentation","year":"2024"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1214\/18-BA1110"}],"event":{"name":"2025 IEEE\/ACM International Conference On Computer Aided Design (ICCAD)","location":"Munich, Germany","start":{"date-parts":[[2025,10,26]]},"end":{"date-parts":[[2025,10,30]]}},"container-title":["2025 IEEE\/ACM International Conference On Computer Aided Design (ICCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11240608\/11240621\/11240990.pdf?arnumber=11240990","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,30]],"date-time":"2026-06-30T20:00:27Z","timestamp":1782849627000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11240990\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,26]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/iccad66269.2025.11240990","relation":{},"subject":[],"published":{"date-parts":[[2025,10,26]]}}}