{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T21:28:36Z","timestamp":1729632516386,"version":"3.28.0"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,3]],"date-time":"2023-03-03T00:00:00Z","timestamp":1677801600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,3]],"date-time":"2023-03-03T00:00:00Z","timestamp":1677801600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3,3]]},"DOI":"10.1109\/iccae56788.2023.10111117","type":"proceedings-article","created":{"date-parts":[[2023,5,3]],"date-time":"2023-05-03T14:06:35Z","timestamp":1683122795000},"page":"161-166","source":"Crossref","is-referenced-by-count":0,"title":["Design of Picoammeter Device Interface Boards for the CTS-5010 Automatic Test Equipment"],"prefix":"10.1109","author":[{"given":"John Rigel","family":"Diaz","sequence":"first","affiliation":[{"name":"Mapua University,Manila,Philippines"}]},{"given":"Kezter","family":"John Fajutagana","sequence":"additional","affiliation":[{"name":"Mapua University,Manila,Philippines"}]},{"given":"Marc Joshua","family":"Dalena","sequence":"additional","affiliation":[{"name":"Mapua University,Manila,Philippines"}]},{"given":"Argie","family":"Flores","sequence":"additional","affiliation":[{"name":"Mapua University,Manila,Philippines"}]},{"given":"Mary Ann","family":"Latina","sequence":"additional","affiliation":[{"name":"Mapua University,Manila,Philippines"}]}],"member":"263","reference":[{"key":"ref13","volume":"137","author":"sedra","year":"1990","journal-title":"Current Conveyor Theory And Practice Curr Conveyor Hist Prog New Results"},{"journal-title":"Low current measurements","year":"2012","author":"measurements","key":"ref12"},{"journal-title":"Interfacebus com","article-title":"Glossary of Electronic and Engineering Terms, ‘DUT’","year":"2018","key":"ref15"},{"journal-title":"Techopedia com","article-title":"What is a Device Under Test (DUT)ƒ - Definition from Techopedia","year":"0","key":"ref14"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1111\/j.1540-5834.2007.00413.x","volume":"72","author":"ii","year":"2007","journal-title":"Monogr Soc Res Child Dev"},{"journal-title":"Measuring picoamperes","year":"2011","author":"volynets","key":"ref10"},{"journal-title":"Pico-current Measurement Challenges and Remedies A Review","year":"2017","author":"mortuza","key":"ref2"},{"journal-title":"Basics of Design Accurately Measure Nanoampere and Picoampere Currents","year":"0","author":"frenzel","key":"ref1"},{"journal-title":"Eesemi com","article-title":"ATE Load Boards\/DUT Boards\/Interface Boards","year":"2018","key":"ref17"},{"journal-title":"Wikiwand","article-title":"DUT board | Wikiwand","year":"2018","key":"ref16"},{"journal-title":"Input and Output Capacitor Selection","year":"2006","author":"arrigo","key":"ref19"},{"journal-title":"Keithley Model 6487 Picoammeter\/Voltage Source Data Sheet Keithley","year":"0","key":"ref18"},{"journal-title":"A study of the effect of integrating low-pass filter in measuring the dynamic performance of a high speed 8-bit analog-to-digital converter (ADC)","year":"2018","author":"latina","key":"ref24"},{"journal-title":"CTS-5010 System Resource Manual","year":"2001","key":"ref23"},{"journal-title":"Keithley Picoammeter Brochure Keithley","year":"0","key":"ref26"},{"journal-title":"Keithley","article-title":"Keithley Picoammeter Model 485 Datasheet","year":"0","key":"ref25"},{"journal-title":"Cadence PCB Design & Analysis","article-title":"The PCB Ground Plane and How It Is Used in Your Design","year":"2020","key":"ref20"},{"journal-title":"Cadence PCB Design & Analysis","article-title":"Effective Component Placement Layout in PCB Design","year":"2020","key":"ref22"},{"journal-title":"Autodesk","article-title":"PCB Routing Tips for Beginners","year":"2016","key":"ref21"},{"journal-title":"Development of device under test (DUT) board of LM741 op-amp IC for test development and measurement track of Mapua University","year":"2017","author":"latina mary ann","key":"ref27"},{"journal-title":"Ecircuitcenter com","year":"2018","key":"ref8"},{"journal-title":"Microchipdeveloper com","article-title":"Input Bias Offset Current - Developer Help","year":"2018","key":"ref7"},{"journal-title":"En-us fluke com","article-title":"What is a digital multimeterƒ","year":"2018","key":"ref9"},{"journal-title":"How to Minimize Errors for Low-Current Measurements – National Instruments","year":"2011","author":"schreier","key":"ref4"},{"journal-title":"Low Current Measurements Number 1671","year":"2012","key":"ref3"},{"journal-title":"What is currentƒ - Definition from WhatIs com","year":"2018","key":"ref6"},{"journal-title":"6th Edition Low Level Measurements Handbook","year":"2004","key":"ref5"}],"event":{"name":"2023 15th International Conference on Computer and Automation Engineering (ICCAE)","start":{"date-parts":[[2023,3,3]]},"location":"Sydney, Australia","end":{"date-parts":[[2023,3,5]]}},"container-title":["2023 15th International Conference on Computer and Automation Engineering (ICCAE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10111091\/10111098\/10111117.pdf?arnumber=10111117","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,12,11]],"date-time":"2023-12-11T19:22:30Z","timestamp":1702322550000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10111117\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3,3]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/iccae56788.2023.10111117","relation":{},"subject":[],"published":{"date-parts":[[2023,3,3]]}}}