{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T10:55:15Z","timestamp":1725533715852},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,11]]},"DOI":"10.1109\/iccchinaw.2015.7961585","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T17:35:54Z","timestamp":1499708154000},"page":"83-87","source":"Crossref","is-referenced-by-count":0,"title":["An applicable testability framework for small satellite under the operational response space"],"prefix":"10.1109","author":[{"family":"Peng Lin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Xu Tian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Xiaojuan Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jingmin Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jianli Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jian Le","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.527945"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2009.5314030"},{"key":"ref12","first-page":"369","article-title":"Implementation of hierarchical design for testability methodology","author":"zhang","year":"2009","journal-title":"9th International Conference on Electronic Measurement and Instruments"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICRMS.2009.5270099"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2009.5347022"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/2.585157"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VALID.2009.8"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/PHM.2008.4711425"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470672"},{"journal-title":"IEEE standard test access port and boundary scan architecture","year":"1990","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2009.5313996"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2008.0141"},{"journal-title":"U S Naval Research Laboratory","year":"2013","key":"ref2"},{"journal-title":"Globalsecurity","year":"2012","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SERA.2008.11"}],"event":{"name":"2015 IEEE\/CIC International Conference on Communications in China - Workshops (CIC\/ICCC)","start":{"date-parts":[[2015,11,2]]},"location":"Shenzhen, China","end":{"date-parts":[[2015,11,4]]}},"container-title":["2015 IEEE\/CIC International Conference on Communications in China - Workshops (CIC\/ICCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7954561\/7961565\/07961585.pdf?arnumber=7961585","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,7,12]],"date-time":"2017-07-12T00:04:19Z","timestamp":1499817859000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7961585\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iccchinaw.2015.7961585","relation":{},"subject":[],"published":{"date-parts":[[2015,11]]}}}