{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,30]],"date-time":"2025-08-30T05:40:08Z","timestamp":1756532408681,"version":"3.44.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,8,4]],"date-time":"2025-08-04T00:00:00Z","timestamp":1754265600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,8,4]],"date-time":"2025-08-04T00:00:00Z","timestamp":1754265600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,8,4]]},"DOI":"10.1109\/icccn65249.2025.11133818","type":"proceedings-article","created":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T17:39:20Z","timestamp":1756489160000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["MODL-CM: Metaheuristic-Optimized Deep Learning Frameworks for IoT-Based Condition Monitoring"],"prefix":"10.1109","author":[{"given":"Akeem B.","family":"Kareem","sequence":"first","affiliation":[{"name":"Kumoh National Institute of Technology,Mechanical and Electronic Convergence Engineering,Department of Aeronautic,Gyeongsangbuk-do,Republic of Korea,39177"}]},{"given":"Jang-Wook","family":"Hur","sequence":"additional","affiliation":[{"name":"Kumoh National Institute of Technology,Mechanical and Electronic Convergence Engineering,Department of Aeronautic,Gyeongsangbuk-do,Republic of Korea,39177"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3003910"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10202487"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3137866"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.07.023"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3212365"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3286447"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2939185"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2845889"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2022077"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2736162"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/pr10061091"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3351604"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3262758"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/APEC43580.2023.10131420"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICBIR57571.2023.10147473"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/app12031186"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2017.02.017"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/electronics11162492"}],"event":{"name":"2025 34th International Conference on Computer Communications and Networks (ICCCN)","start":{"date-parts":[[2025,8,4]]},"location":"Tokyo, Japan","end":{"date-parts":[[2025,8,7]]}},"container-title":["2025 34th International Conference on Computer Communications and Networks (ICCCN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11133715\/11133717\/11133818.pdf?arnumber=11133818","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,30]],"date-time":"2025-08-30T05:11:18Z","timestamp":1756530678000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11133818\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8,4]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/icccn65249.2025.11133818","relation":{},"subject":[],"published":{"date-parts":[[2025,8,4]]}}}