{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T20:32:22Z","timestamp":1730233942886,"version":"3.28.0"},"reference-count":39,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/icccs49078.2020.9118589","type":"proceedings-article","created":{"date-parts":[[2020,6,16]],"date-time":"2020-06-16T17:44:02Z","timestamp":1592329442000},"page":"384-390","source":"Crossref","is-referenced-by-count":0,"title":["An Image Reconstruction For Electrical Capacitance Tomography Using Parametric Level Set"],"prefix":"10.1109","author":[{"given":"Rui","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yongfu","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lihui","family":"Peng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xinghe","family":"Liao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1137\/100800208"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/14\/3\/018"},{"key":"ref33","first-page":"4","article-title":"Reconstruction algorithms for permittivity and conductivity imaging[C]","volume":"2001","author":"lionheart","year":"2001","journal-title":"Proceedings of the 2nd World Congress on Industrial Process Tomography"},{"key":"ref32","first-page":"87","article-title":"A Calculation Method of Sensitivity Distribution with Electrical Capacitance Tomography","volume":"23","author":"mou","year":"2006","journal-title":"Chin J Comput Phys"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2004.825039"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/s19112514"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/25\/10\/105602"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1023\/A:1020874308076"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/IST.2014.6958445"},{"key":"ref34","first-page":"233","article-title":"A noniterative inversion method for electrical resistance, capacitance and inductance tomography for two phase materials[C]","author":"tamburrino","year":"2003","journal-title":"Proc 3rd World Congress on Industrial Process Tomography Canada"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/10\/11\/315"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/7\/3\/004"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S1385-8947(99)00134-5"},{"key":"ref13","article-title":"Total variation regularization in EIT reconstruction","author":"borsic","year":"2001","journal-title":"Proceedings of the 2nd World Congress on Industrial Process Tomography"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/16\/10\/014"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.2307\/2669959"},{"journal-title":"Rank Deficient and Discrete IIl-Posed Problems Numerical Aspects of Linear Inversion","year":"2005","author":"hansen","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2011.2159773"},{"key":"ref18","article-title":"Extension of SBL algorithms for the recovery of block sparse signals with intra-block correlation","author":"zhang","year":"2012","journal-title":"IEEE Trans on Signal Processing"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IST.2017.8261491"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2017.2756078"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/el:19880283"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2006.877112"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3735\/22\/3\/009"},{"key":"ref6","first-page":"215","article-title":"An improved normalisation approach for electrical capacitance tomography","author":"yang","year":"1999","journal-title":"First World Congr Industrial Process Tomography"},{"key":"ref29","article-title":"Modelling of electrical capacitance array for water leakage imaging inside porous slab","author":"li","year":"2017","journal-title":"Proceedings of the IEEE International Conference on Imaging Systems and Techniques (IST)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/1\/201"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.1985.325526"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3735\/17\/9\/002"},{"key":"ref2","volume":"37","author":"fasching","year":"1988","journal-title":"High resolution capacitance imaging system"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/42.232256"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/ip-a-2.1989.0031"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2816739"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/0021-9991(88)90002-2"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2701098"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcp.2004.11.022"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1051\/cocv:1996101"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1080\/17415970500264152"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.nucengdes.2015.04.023"}],"event":{"name":"2020 5th International Conference on Computer and Communication Systems (ICCCS)","start":{"date-parts":[[2020,5,15]]},"location":"Shanghai, China","end":{"date-parts":[[2020,5,18]]}},"container-title":["2020 5th International Conference on Computer and Communication Systems (ICCCS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9114888\/9118408\/09118589.pdf?arnumber=9118589","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T20:09:45Z","timestamp":1656360585000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9118589\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/icccs49078.2020.9118589","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}