{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T20:35:00Z","timestamp":1730234100901,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,4,23]],"date-time":"2021-04-23T00:00:00Z","timestamp":1619136000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,4,23]],"date-time":"2021-04-23T00:00:00Z","timestamp":1619136000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,4,23]],"date-time":"2021-04-23T00:00:00Z","timestamp":1619136000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,4,23]]},"DOI":"10.1109\/icccs52626.2021.9449290","type":"proceedings-article","created":{"date-parts":[[2021,6,21]],"date-time":"2021-06-21T16:41:56Z","timestamp":1624293716000},"page":"1075-1078","source":"Crossref","is-referenced-by-count":0,"title":["Design of microwave near-field microscope analyzer for material chips and Realization of a system"],"prefix":"10.1109","author":[{"given":"Baoguo","family":"Yang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fushun","family":"Nian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong","family":"Xiang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhenyu","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lijun","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chunqing","family":"Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/16\/1\/033"},{"key":"ref3","first-page":"630","article-title":"New scanning near-field microwave microscopy","volume":"10","author":"chen","year":"1996","journal-title":"Journal of Physics"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.2949109"},{"key":"ref5","first-page":"215","article-title":"Principles of Near-Field Microwave Microscopy","volume":"1","author":"anlage","year":"2006","journal-title":"Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale"},{"key":"ref2","first-page":"178","volume":"409","author":"binnig","year":"1982","journal-title":"Tunneling through a controllable vacuum gap [J]"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/14786440808564615"}],"event":{"name":"2021 IEEE 6th International Conference on Computer and Communication Systems (ICCCS)","start":{"date-parts":[[2021,4,23]]},"location":"Chengdu, China","end":{"date-parts":[[2021,4,26]]}},"container-title":["2021 IEEE 6th International Conference on Computer and Communication Systems (ICCCS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9449108\/9449090\/09449290.pdf?arnumber=9449290","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T11:42:23Z","timestamp":1652182943000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9449290\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,4,23]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/icccs52626.2021.9449290","relation":{},"subject":[],"published":{"date-parts":[[2021,4,23]]}}}