{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:43:00Z","timestamp":1749620580297},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iccd.2004.1347921","type":"proceedings-article","created":{"date-parts":[[2004,11,8]],"date-time":"2004-11-08T16:28:24Z","timestamp":1099931304000},"page":"192-199","source":"Crossref","is-referenced-by-count":4,"title":["Diagnosis of hold time defects"],"prefix":"10.1109","author":[{"family":"Zhiyuan Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Marek-Sadowska","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Kun-Han Tsai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Rajski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"IEEE DASC Standard Delay Format (SDF)","year":"0","key":"17"},{"key":"15","doi-asserted-by":"crossref","DOI":"10.1109\/ISQED.2004.1283720","article-title":"Delay fault diagnosis using timing information","author":"wang","year":"2004","journal-title":"Int Symp on Quality Electronic Design"},{"key":"16","first-page":"217","article-title":"Diagnosis of scan chain failures","author":"wu","year":"0","journal-title":"Proc IEEE Int Symp on 1998"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/54.970425"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271092"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894220"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/4.918917"},{"key":"3","first-page":"268","article-title":"A technique for fault diagnosis of defects in scan chains","author":"guo","year":"0","journal-title":"Proc Int Test Conf 2001"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512645"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/4.726547"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639683"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270854"},{"key":"6","first-page":"44","article-title":"Efficient diagnosis for multiple intermittent scan chain hold-time faults","author":"huang","year":"2003","journal-title":"Asian Test Symposium"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/92.974902"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/43.806806"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/4.962284"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/92.335019"}],"event":{"name":"IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings.","location":"San Jose, CA, USA"},"container-title":["IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9333\/29644\/01347921.pdf?arnumber=1347921","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T11:38:38Z","timestamp":1497613118000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1347921\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/iccd.2004.1347921","relation":{},"subject":[]}}