{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T18:40:32Z","timestamp":1729622432063,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2006,10]]},"DOI":"10.1109\/iccd.2006.4380851","type":"proceedings-article","created":{"date-parts":[[2007,11,13]],"date-time":"2007-11-13T21:54:59Z","timestamp":1194990899000},"page":"425-431","source":"Crossref","is-referenced-by-count":0,"title":["A New Class of Sequential Circuits with Acyclic Test Generation Complexity"],"prefix":"10.1109","author":[{"given":"Chia Yee","family":"Ooi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hideo","family":"Fujiwara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/12.869321"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/12.54846"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"852","DOI":"10.1109\/43.720320","article-title":"Cost-free scan: A low-overhead scan path design","volume":"17","author":"lin","year":"1998","journal-title":"IEEE Trans CAD Integr Circuits Syst"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1093\/ietisy\/e88-d.12.2738"},{"key":"ref5","first-page":"348","article-title":"Classification of sequential circuits based on ?k notation","author":"ooi","year":"2004","journal-title":"Proc IEEE 13th ATS"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.57"},{"key":"ref7","first-page":"190","article-title":"An optimal time expansion model based on combinational A TPG for R T level circuits","author":"inoue","year":"1998","journal-title":"IEEE 7th ATS"},{"key":"ref2","first-page":"22","article-title":"Why is ATPG easy?","author":"prasad","year":"1999","journal-title":"Proc 36th DAC"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2005.8"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1980.1585232"}],"event":{"name":"2006 International Conference on Computer Design","start":{"date-parts":[[2007,10,1]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2007,10,4]]}},"container-title":["2006 International Conference on Computer Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4380776\/4380777\/04380851.pdf?arnumber=4380851","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T00:35:46Z","timestamp":1497746146000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4380851\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2006,10]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iccd.2006.4380851","relation":{},"ISSN":["1063-6404"],"issn-type":[{"type":"print","value":"1063-6404"}],"subject":[],"published":{"date-parts":[[2006,10]]}}}