{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T13:37:24Z","timestamp":1725543444509},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2006,10]]},"DOI":"10.1109\/iccd.2006.4380852","type":"proceedings-article","created":{"date-parts":[[2007,11,13]],"date-time":"2007-11-13T21:54:59Z","timestamp":1194990899000},"page":"432-437","source":"Crossref","is-referenced-by-count":4,"title":["Efficient Testing of RF MIMO Transceivers Used in WLAN Applications"],"prefix":"10.1109","author":[{"given":"Erkan","family":"Acar","sequence":"first","affiliation":[]},{"given":"Sule","family":"Ozev","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583999"},{"key":"ref11","first-page":"801","article-title":"Use of embedded sensors for built-in-test RF circuits","author":"bhattacharya","year":"2005","journal-title":"IEEE International Conference on TEST"},{"key":"ref12","first-page":"257","article-title":"Design of a new RF BIST Circuit for 5.25GHz Low Noise Amplifiers","author":"ryu","year":"2004","journal-title":"Bipolar\/BiCMOS Circuits and Technology"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.821912"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/GLOCOM.2001.965169"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/RAWCON.2004.1389095"},{"key":"ref16","first-page":"893","article-title":"On the impact of multi-antenna RF transceivers' amplitude and phase mismatches on transmit MRC","author":"khaled","year":"2005","journal-title":"IEEE International Conference on Acoustics Speech and Signal Processing"},{"journal-title":"Agilent 83236B PCS Interface Documentation","year":"2006","key":"ref17"},{"journal-title":"Specification of the Bluetooth System","year":"2001","author":"nord","key":"ref18"},{"journal-title":"RF Microelectronics","year":"1998","author":"razavi","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2005.1560043"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"494","DOI":"10.1145\/127601.127718","article-title":"Optimal ordering of analog integrated circuit tests to minimize test time","author":"huss","year":"1991","journal-title":"28th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref6","first-page":"659","article-title":"Building an RF source for low cost testers using an ADPLL coltrolled by Texas Instruments digital signal processor DSP TMS320C5402","author":"sylla","year":"2003","journal-title":"IEEE International Test Conference"},{"key":"ref5","first-page":"161","article-title":"Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog\/RF Circuits","author":"liu","year":"2005","journal-title":"International Conference on Computer Design"},{"key":"ref8","first-page":"948","article-title":"Moving from mixed-signal to RF test hardware development","author":"ferrario","year":"2003","journal-title":"IEEE International Test Conference"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2003.1232241"},{"key":"ref2","first-page":"1346","article-title":"Combined effects of RF impairments in the future IEEE 802. l l n WLAN systems","author":"woo","year":"2005","journal-title":"Vehicular Technology Conference"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387342"},{"journal-title":"CRC Handbook on Signal Processing for Communications","year":"2004","author":"bolcskei","key":"ref1"},{"journal-title":"The Design of CMOS Radio-Frequency Integrated Circuits","year":"2004","author":"lee","key":"ref20"}],"event":{"name":"2006 International Conference on Computer Design","start":{"date-parts":[[2007,10,1]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2007,10,4]]}},"container-title":["2006 International Conference on Computer Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4380776\/4380777\/04380852.pdf?arnumber=4380852","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T00:35:46Z","timestamp":1497746146000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4380852\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2006,10]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/iccd.2006.4380852","relation":{},"ISSN":["1063-6404"],"issn-type":[{"type":"print","value":"1063-6404"}],"subject":[],"published":{"date-parts":[[2006,10]]}}}