{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T16:59:20Z","timestamp":1754153960857,"version":"3.41.2"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2007,10,1]],"date-time":"2007-10-01T00:00:00Z","timestamp":1191196800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2007,10,1]],"date-time":"2007-10-01T00:00:00Z","timestamp":1191196800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,10]]},"DOI":"10.1109\/iccd.2007.4601927","type":"proceedings-article","created":{"date-parts":[[2008,8,21]],"date-time":"2008-08-21T11:14:39Z","timestamp":1219317279000},"page":"376-381","source":"Crossref","is-referenced-by-count":2,"title":["Modeling soft error effects considering process variations"],"prefix":"10.1109","author":[{"family":"Chong Zhao","sequence":"first","affiliation":[{"name":"Department of ECE, University of California at San Diego, La Jolla, 92093, USA"}]},{"family":"Sujit Dey","sequence":"additional","affiliation":[{"name":"Department of ECE, University of California at San Diego, La Jolla, 92093, USA"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/5.90110"},{"journal-title":"Predictive Technology Model","year":"0","key":"ref11"},{"key":"ref12","first-page":"585","article-title":"New generation of Predictive Technology Model for sub-45nm design exploration","author":"zhao","year":"0","journal-title":"ISQED'06"},{"journal-title":"Probability and Statistics for Engineers and Scientists","year":"1993","author":"walpole","key":"ref13"},{"key":"ref4","first-page":"773","article-title":"Statistical optimization of leakage power considering process variations using dual-Vth and sizing","author":"srivastava","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/378239.379043"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1982.4336490"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"},{"journal-title":"Principles of CMOS VLSI Design A System Perspective","year":"1993","author":"weste","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.35"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2003.1214358"},{"key":"ref9","first-page":"4.3.1","article-title":"Probabilistic Estimates of Upset Caused by Single Event Transients","author":"hass","year":"1999","journal-title":"8th NASA Symposium on VLIS Design"}],"event":{"name":"2007 25th International Conference on Computer Design ICCD 2007","start":{"date-parts":[[2007,10,7]]},"location":"Lake Tahoe, CA, USA","end":{"date-parts":[[2007,10,10]]}},"container-title":["2007 25th International Conference on Computer Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4591423\/4601871\/04601927.pdf?arnumber=4601927","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,23]],"date-time":"2025-07-23T18:35:36Z","timestamp":1753295736000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/4601927\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,10]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iccd.2007.4601927","relation":{},"subject":[],"published":{"date-parts":[[2007,10]]}}}