{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:11:48Z","timestamp":1747807908608},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/iccd.2008.4751834","type":"proceedings-article","created":{"date-parts":[[2009,1,20]],"date-time":"2009-01-20T20:27:15Z","timestamp":1232483235000},"page":"14-20","source":"Crossref","is-referenced-by-count":22,"title":["A novel, highly SEU tolerant digital circuit design approach"],"prefix":"10.1109","author":[{"given":"Rajesh","family":"Garg","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sunil P.","family":"Khatri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1029\/92JA02670"},{"year":"0","key":"17"},{"year":"0","key":"18"},{"key":"15","article-title":"scaling and technology issues for soft error rate","author":"johnston","year":"2000","journal-title":"Proc Annual Research Conference on Reliability"},{"year":"0","key":"16"},{"year":"0","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.1999.867224"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.1993.316521"},{"year":"0","key":"12"},{"year":"0","key":"3"},{"journal-title":"Envisia Silicon Ensemble Place-and-Route Reference","year":"1999","key":"20"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1981.4335656"},{"year":"0","key":"1"},{"year":"0","key":"10"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484705"},{"year":"0","key":"6"},{"year":"0","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.1993.700568"},{"year":"0","key":"8"}],"event":{"name":"2008 IEEE International Conference on Computer Design (ICCD)","start":{"date-parts":[[2008,10,12]]},"location":"Lake Tahoe, CA, USA","end":{"date-parts":[[2008,10,15]]}},"container-title":["2008 IEEE International Conference on Computer Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4740204\/4751825\/04751834.pdf?arnumber=4751834","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T19:33:48Z","timestamp":1489779228000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4751834\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/iccd.2008.4751834","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}