{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T20:34:15Z","timestamp":1730234055302,"version":"3.28.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,10]]},"DOI":"10.1109\/iccd.2009.5413156","type":"proceedings-article","created":{"date-parts":[[2010,2,17]],"date-time":"2010-02-17T18:35:32Z","timestamp":1266431732000},"page":"179-185","source":"Crossref","is-referenced-by-count":1,"title":["A distributed concurrent on-line test scheduling protocol for many-core NoC-based systems"],"prefix":"10.1109","author":[{"given":"Jason D.","family":"Lee","sequence":"first","affiliation":[]},{"given":"Rabi N.","family":"Mahapatra","sequence":"additional","affiliation":[]},{"given":"Praveen S.","family":"Bhojwani","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270888"},{"journal-title":"Intel Tera-scale Computing Research Program","year":"0","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1137\/040618655"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICPP.2005.59"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2008.4751863"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403590"},{"key":"ref16","first-page":"1","article-title":"VAST: Virtualization-Assisted Concurrent Autonomous Self-Test","author":"li","year":"2008","journal-title":"Proc International Test Conference (ITC)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2005.38"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s10766-006-0014-1"},{"journal-title":"NoCSim","year":"0","key":"ref19"},{"key":"ref4","first-page":"867","article-title":"An Infrastructure IP for On-Line Testing of Network-on-Chip Based SoCs","author":"bhojwani","year":"2007","journal-title":"Proc IEEE Intl Symp on Quality Electronic Devices"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2006.41"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"key":"ref5","first-page":"670","article-title":"A Robust Protocol for Concurrent On-Line Test (COLT) of NoC-based Systems-on-a-Chip","author":"bhojwani","year":"2007","journal-title":"Proc Design Automation (DAC)"},{"key":"ref8","article-title":"Lee Distance and Topological Properties of k-ary n-cubes","volume":"44","author":"broeg","year":"1995","journal-title":"IEEE Trans Computer"},{"key":"ref7","first-page":"746","article-title":"Thousand Core Chips – A Technology Perspective","author":"borkar","year":"2007","journal-title":"Proc Design Automation (DAC)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.12.004"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1023\/A:1019198412754"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/2.976921"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852438"},{"journal-title":"Sun Microsystems OpenSPARC T1 Processor","year":"0","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MSE.2007.44"},{"journal-title":"Tilera Corporation","year":"0","key":"ref24"},{"journal-title":"Synopsys Design Compiler","year":"0","key":"ref23"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003776"}],"event":{"name":"2009 IEEE International Conference on Computer Design (ICCD 2009)","start":{"date-parts":[[2009,10,4]]},"location":"Lake Tahoe, CA, USA","end":{"date-parts":[[2009,10,7]]}},"container-title":["2009 IEEE International Conference on Computer Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5406656\/5413104\/05413156.pdf?arnumber=5413156","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T20:27:05Z","timestamp":1489868825000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5413156\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,10]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/iccd.2009.5413156","relation":{},"subject":[],"published":{"date-parts":[[2009,10]]}}}