{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:55:51Z","timestamp":1747810551864},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,10]]},"DOI":"10.1109\/iccd.2009.5413175","type":"proceedings-article","created":{"date-parts":[[2010,2,17]],"date-time":"2010-02-17T13:35:32Z","timestamp":1266413732000},"source":"Crossref","is-referenced-by-count":26,"title":["Quality improvement and cost reduction using statistical outlier methods"],"prefix":"10.1109","author":[{"given":"Amit","family":"Nahar","sequence":"first","affiliation":[]},{"given":"Kennet","family":"Butler","sequence":"additional","affiliation":[]},{"given":"John M.","family":"Carulli","sequence":"additional","affiliation":[]},{"given":"Charles","family":"Weinberger","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"92","article-title":"Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data","author":"daasch","year":"2001","journal-title":"IEEE International Test Conference 2001"},{"key":"ref11","first-page":"565","article-title":"Screening VDSM Outliers Using Nominal and Subthreshold Supply Voltage IDDQ","author":"schuermyer","year":"2003","journal-title":"Proceedings IEEE Int Test Conference"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251278"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"954","DOI":"10.1109\/TEST.2002.1041851","article-title":"Improved IDDQ Testing with Empirical Linear Prediction","author":"bergman","year":"2002","journal-title":"Proc 2002 IEEE Int Test Conf"},{"key":"ref14","first-page":"82","article-title":"Improved wafer-level spatial analysis for I_DDQ limit setting","author":"sabade","year":"2001","journal-title":"Proc 2001 IEEE Int Test Conf"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250104"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008365918776"},{"key":"ref17","article-title":"The practice of statistics","author":"yates","year":"0"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557138"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/BF00135333"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270914"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"1168","DOI":"10.1109\/TEST.1998.743360","article-title":"Current Signatures: Application","author":"gattiker","year":"1998","journal-title":"Proc 1998 IEEE Int Test Conf"},{"key":"ref8","first-page":"81","article-title":"Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing Burn-in Reduction","author":"sabade","year":"2002","journal-title":"Proc VLSI Test Symp 2002"},{"key":"ref7","article-title":"Guidelines for Part Average Testing (PAT)","year":"2003","journal-title":"AEC-Q001-Rev-C"},{"key":"ref2","first-page":"310","article-title":"Testing CMOS IDD on Large Devices","author":"crapuchettes","year":"1987","journal-title":"Proc 1987 IEEE Int Test Conf"},{"key":"ref1","article-title":"International Technology Roadmap for Semiconductors","year":"0"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"189","DOI":"10.1109\/TEST.2000.894206","article-title":"Variance Reduction Using Wafer Patterns in IDDQ Data","author":"daasch","year":"2000","journal-title":"Proceedings IEEE International Test Conference 2000"}],"event":{"name":"2009 IEEE International Conference on Computer Design (ICCD 2009)","location":"Lake Tahoe, CA, USA","start":{"date-parts":[[2009,10,4]]},"end":{"date-parts":[[2009,10,7]]}},"container-title":["2009 IEEE International Conference on Computer Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5406656\/5413104\/05413175.pdf?arnumber=5413175","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T00:56:06Z","timestamp":1497833766000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5413175\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,10]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/iccd.2009.5413175","relation":{},"subject":[],"published":{"date-parts":[[2009,10]]}}}