{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T16:00:40Z","timestamp":1761580840060},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,10]]},"DOI":"10.1109\/iccd.2010.5647651","type":"proceedings-article","created":{"date-parts":[[2010,12,9]],"date-time":"2010-12-09T10:42:09Z","timestamp":1291891329000},"page":"474-479","source":"Crossref","is-referenced-by-count":13,"title":["DfT optimization for pre-bond testing of 3D-SICs containing TSVs"],"prefix":"10.1109","author":[{"given":"Jia","family":"Li","sequence":"first","affiliation":[]},{"given":"Dong","family":"Xiang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2009.125"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355573"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.136"},{"key":"7","article-title":"Reducing power supply noise in linear-decompressor-based test data compression environment for at-speed scan testing","author":"wu","year":"2008","journal-title":"Proceedings IEEE International Test Conference (ITC)"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2008.4751864"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2007.4601902"},{"key":"4","article-title":"A scan-island based design enabling pre-bond testability in die-stacked microprocessors","author":"lewis","year":"2007","journal-title":"Proceedings IEEE International Test Conference (ITC)"},{"key":"9","first-page":"536","article-title":"Multi-level hypergraph partitioning: Applications in VLSI design","author":"karypis","year":"1997","journal-title":"Proceedings ACM\/IEEE Design Automation Conference (DAC)"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687434"}],"event":{"name":"2010 IEEE International Conference on Computer Design (ICCD 2010)","start":{"date-parts":[[2010,10,3]]},"location":"Amsterdam, Netherlands","end":{"date-parts":[[2010,10,6]]}},"container-title":["2010 IEEE International Conference on Computer Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5640356\/5647518\/05647651.pdf?arnumber=5647651","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T06:43:23Z","timestamp":1490078603000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5647651\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,10]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/iccd.2010.5647651","relation":{},"subject":[],"published":{"date-parts":[[2010,10]]}}}