{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T00:20:27Z","timestamp":1725668427282},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/iccd.2015.7357116","type":"proceedings-article","created":{"date-parts":[[2015,12,17]],"date-time":"2015-12-17T16:57:06Z","timestamp":1450371426000},"page":"289-295","source":"Crossref","is-referenced-by-count":6,"title":["Performance optimization for on-chip sensors to detect recycled ICs"],"prefix":"10.1109","author":[{"given":"Bicky","family":"Shakya","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ujjwal","family":"Guin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mark","family":"Tehranipoor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Domenic","family":"Forte","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"291","article-title":"Active hardware metering for intellectual property protection and security","author":"alkabani","year":"2007","journal-title":"Usenix Security"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593102"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2264063"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593157"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917502"},{"key":"ref15","article-title":"Novel self-calibrating recycling sensor using schmitt-trigger and voltage boosting for fine-grained detection","author":"cheng","year":"2015","journal-title":"Proc IEEE Int Symp Quality Electronic Design (ISQED)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.10.006"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.812927"},{"year":"2015","key":"ref18","article-title":"Error function - Wikipedia, the free encyclopedia"},{"journal-title":"Counterfeit parts found on P-8 Poseidons Online DefenseTech org","year":"2011","author":"reed","key":"ref4"},{"key":"ref3","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-319-11824-6","author":"tehranipoor","year":"2015","journal-title":"Counterfeit Integrated Circuits - Detection and Avoidance"},{"journal-title":"SAE","article-title":"G-19A test laboratory standards development committee, Fraudulent Counterfeit Electronic Parts; Avoidance, Detection, Mitigation, and Disposition","year":"2013","key":"ref6"},{"journal-title":"Massachusetts man pleads guilty to importing and selling counterfeit integrated circuits from China and Hongkong Office of Public Affairs","article-title":"U. Department of Justice","year":"2014","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2014.6962099"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2012.6378191"},{"journal-title":"Introduction to Hardware Security and Trust","year":"2011","author":"tehranipoor","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2332291"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2012.6378192"}],"event":{"name":"2015 33rd IEEE International Conference on Computer Design (ICCD)","start":{"date-parts":[[2015,10,18]]},"location":"New York City, NY, USA","end":{"date-parts":[[2015,10,21]]}},"container-title":["2015 33rd IEEE International Conference on Computer Design (ICCD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7347055\/7357071\/07357116.pdf?arnumber=7357116","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,16]],"date-time":"2023-08-16T01:53:21Z","timestamp":1692150801000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7357116"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iccd.2015.7357116","relation":{},"subject":[],"published":{"date-parts":[[2015,10]]}}}