{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T20:49:33Z","timestamp":1730234973273,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,7,9]],"date-time":"2024-07-09T00:00:00Z","timestamp":1720483200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,7,9]],"date-time":"2024-07-09T00:00:00Z","timestamp":1720483200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,7,9]]},"DOI":"10.1109\/icce-taiwan62264.2024.10674059","type":"proceedings-article","created":{"date-parts":[[2024,9,18]],"date-time":"2024-09-18T17:51:53Z","timestamp":1726681913000},"page":"349-350","source":"Crossref","is-referenced-by-count":0,"title":["Optimized YOLOv5 and Spatial Pyramid Pooling to Enhance Industrial Defect Detection"],"prefix":"10.1109","author":[{"given":"Su","family":"Ming-Hsiang","sequence":"first","affiliation":[{"name":"Soochow University,Department of Data Science,Taipei,Taiwan"}]},{"given":"Jian","family":"Zhi-Juan","sequence":"additional","affiliation":[{"name":"Soochow University,Department of Data Science,Taipei,Taiwan"}]}],"member":"263","reference":[{"article-title":"IH-ViT: Vision Transformer-based Integrated Circuit Appear-ance Defect Detection","year":"2023","author":"Wang","key":"ref1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/app122312312"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-021-01084-x"},{"key":"ref4","first-page":"7235","article-title":"Surface Defect Detection Model for Aero-Engine Components Based on Improved YOLOv5","volume-title":"Appl. Sci","volume":"12","author":"Li","year":"2022"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3180796"},{"key":"ref6","first-page":"22136","article-title":"Surface defect detection of industrial components based on vision","volume-title":"Sci Rep","volume":"13","author":"Chen","year":"2023"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2015.2389824"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12051257"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3389\/fmars.2022.1056300"}],"event":{"name":"2024 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)","start":{"date-parts":[[2024,7,9]]},"location":"Taichung, Taiwan","end":{"date-parts":[[2024,7,11]]}},"container-title":["2024 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10673884\/10673887\/10674059.pdf?arnumber=10674059","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,20]],"date-time":"2024-09-20T05:36:32Z","timestamp":1726810592000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10674059\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,7,9]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/icce-taiwan62264.2024.10674059","relation":{},"subject":[],"published":{"date-parts":[[2024,7,9]]}}}