{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,2]],"date-time":"2024-09-02T05:07:36Z","timestamp":1725253656839},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,1,10]],"date-time":"2021-01-10T00:00:00Z","timestamp":1610236800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,10]],"date-time":"2021-01-10T00:00:00Z","timestamp":1610236800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,10]],"date-time":"2021-01-10T00:00:00Z","timestamp":1610236800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,1,10]]},"DOI":"10.1109\/icce50685.2021.9427722","type":"proceedings-article","created":{"date-parts":[[2021,5,13]],"date-time":"2021-05-13T19:57:02Z","timestamp":1620935822000},"source":"Crossref","is-referenced-by-count":3,"title":["Sparse Coding of Intra Prediction Residuals for Screen Content Coding"],"prefix":"10.1109","author":[{"given":"Michael G.","family":"Schimpf","sequence":"first","affiliation":[]},{"given":"Nam","family":"Ling","sequence":"additional","affiliation":[]},{"given":"Yunhui","family":"Shi","sequence":"additional","affiliation":[]},{"given":"Ying","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"Rate distortion optimized quantization in the JM reference software","author":"limin","year":"2008","journal-title":"JVT-AA027"},{"key":"ref11","article-title":"Common test conditions for screen content coding","author":"yu","year":"2017","journal-title":"JCTVC-Z1015"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2012.2223055"},{"key":"ref13","article-title":"JVET common test conditions and software reference configurations","author":"suehring","year":"2016","journal-title":"JVET-B1010"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2006.881199"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2015.2478706"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7527361"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.1993.342465"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2011.5937513"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2013.2256917"},{"key":"ref2","article-title":"HEVC Reference Software HM-16.18+SCM-8.7","year":"2018"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2012.2221525"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2018.2847228"}],"event":{"name":"2021 IEEE International Conference on Consumer Electronics (ICCE)","location":"Las Vegas, NV, USA","start":{"date-parts":[[2021,1,10]]},"end":{"date-parts":[[2021,1,12]]}},"container-title":["2021 IEEE International Conference on Consumer Electronics (ICCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9427462\/9427578\/09427722.pdf?arnumber=9427722","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:41:27Z","timestamp":1652197287000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9427722\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,1,10]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/icce50685.2021.9427722","relation":{},"subject":[],"published":{"date-parts":[[2021,1,10]]}}}