{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T00:31:41Z","timestamp":1725582701388},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,1,7]],"date-time":"2022-01-07T00:00:00Z","timestamp":1641513600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,7]],"date-time":"2022-01-07T00:00:00Z","timestamp":1641513600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,1,7]]},"DOI":"10.1109\/icce53296.2022.9730304","type":"proceedings-article","created":{"date-parts":[[2022,3,15]],"date-time":"2022-03-15T19:55:19Z","timestamp":1647374119000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Edge Device Based Stress Detection For Older Adults With Cortisol Biomarker"],"prefix":"10.1109","author":[{"given":"Joseph","family":"Clark","sequence":"first","affiliation":[{"name":"University of Tennessee,Department of Electrical Engineering and Computer Science,Knoxville,TN,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Himanshu","family":"Thapliyal","sequence":"additional","affiliation":[{"name":"University of Tennessee,Department of Electrical Engineering and Computer Science,Knoxville,TN,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1038\/nrendo.2009.106"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1097\/01.psy.0000174172.82428.ce"},{"key":"ref10","article-title":"sklearn-porter,” transpile trained scikit-learn estimators to C","author":"morawiec","year":"0","journal-title":"Java JavaScript and others"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/ISCC50000.2020.9219716"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.2196\/10140"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/MCE.2017.2715578"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1007\/s11265-020-01611-5"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1007\/s10522-010-9287-2"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1080\/01621459.1990.10475311"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.3389\/fpsyg.2012.00179"}],"event":{"name":"2022 IEEE International Conference on Consumer Electronics (ICCE)","start":{"date-parts":[[2022,1,7]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2022,1,9]]}},"container-title":["2022 IEEE International Conference on Consumer Electronics (ICCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9730107\/9730121\/09730304.pdf?arnumber=9730304","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,10]],"date-time":"2022-06-10T21:51:46Z","timestamp":1654897906000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9730304\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,1,7]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/icce53296.2022.9730304","relation":{},"subject":[],"published":{"date-parts":[[2022,1,7]]}}}