{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,3]],"date-time":"2026-04-03T14:56:09Z","timestamp":1775228169670,"version":"3.50.1"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,1,6]],"date-time":"2024-01-06T00:00:00Z","timestamp":1704499200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,6]],"date-time":"2024-01-06T00:00:00Z","timestamp":1704499200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,1,6]]},"DOI":"10.1109\/icce59016.2024.10444213","type":"proceedings-article","created":{"date-parts":[[2024,2,28]],"date-time":"2024-02-28T18:47:20Z","timestamp":1709146040000},"page":"1-5","source":"Crossref","is-referenced-by-count":13,"title":["Multi-Modal and Multi-Task Depression Detection with Sentiment Assistance"],"prefix":"10.1109","author":[{"given":"Shiyu","family":"Teng","sequence":"first","affiliation":[{"name":"Ritsumeikan University,Graduate School of Information Science and Engineering,Shiga,Japan"}]},{"given":"Shurong","family":"Chai","sequence":"additional","affiliation":[{"name":"Ritsumeikan University,Graduate School of Information Science and Engineering,Shiga,Japan"}]},{"given":"Jiaqing","family":"Liu","sequence":"additional","affiliation":[{"name":"Ritsumeikan University,Graduate School of Information Science and Engineering,Shiga,Japan"}]},{"given":"Tomoko","family":"Tateyama","sequence":"additional","affiliation":[{"name":"Fujita Health University,Department of Intelligent Information Engineering,Aichi,Japan"}]},{"given":"Lanfen","family":"Lin","sequence":"additional","affiliation":[{"name":"Zhejiang University,College of Computer Science and Technology,Zhejiang,China"}]},{"given":"Yen-Wei","family":"Chen","sequence":"additional","affiliation":[{"name":"Ritsumeikan University,Graduate School of Information Science and Engineering,Shiga,Japan"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3389\/fpsyg.2021.648383"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1177\/2167702614536163"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1176\/appi.ajp.161.12.2163"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1046\/j.1525-1497.2001.016009606.x"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1037\/t00742-000"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1177\/014662167700100306"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/GCCE56475.2022.10014157"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3503161.3548025"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TAFFC.2022.3233070"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-79161-2_14"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/s21144764"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1136\/jnnp.2004.036079"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MCI.2020.2998234"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP43922.2022.9746634"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.18653\/v1\/P18-1208"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/3347320.3357688"},{"key":"ref17","article-title":"Bert: Pre-training of deep bidirectional transformers for language understanding","author":"Devlin","year":"2018","journal-title":"arXiv preprint arXiv:1810.04805"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.2307\/2532051"},{"key":"ref19","first-page":"3123","article-title":"The distress analysis interview corpus of human and computer interviews","author":"Gratch","year":"2014","journal-title":"LREC"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3347320.3357691"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/3347320.3357694"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3347320.3357696"}],"event":{"name":"2024 IEEE International Conference on Consumer Electronics (ICCE)","location":"Las Vegas, NV, USA","start":{"date-parts":[[2024,1,6]]},"end":{"date-parts":[[2024,1,8]]}},"container-title":["2024 IEEE International Conference on Consumer Electronics (ICCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10444098\/10444131\/10444213.pdf?arnumber=10444213","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T05:32:49Z","timestamp":1709271169000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10444213\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,1,6]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/icce59016.2024.10444213","relation":{},"subject":[],"published":{"date-parts":[[2024,1,6]]}}}