{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,19]],"date-time":"2025-12-19T10:03:23Z","timestamp":1766138603290,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,1,6]],"date-time":"2024-01-06T00:00:00Z","timestamp":1704499200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,6]],"date-time":"2024-01-06T00:00:00Z","timestamp":1704499200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100013276","name":"Interreg","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100013276","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,1,6]]},"DOI":"10.1109\/icce59016.2024.10444494","type":"proceedings-article","created":{"date-parts":[[2024,2,28]],"date-time":"2024-02-28T13:47:20Z","timestamp":1709128040000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Studying the Effects of Prolonged Thermal Stress Aiming to Induce Artificial Aging on DRAM Retention-Based Physical Unclonable Functions"],"prefix":"10.1109","author":[{"given":"Nikolaos Athanasios","family":"Anagnostopoulos","sequence":"first","affiliation":[{"name":"University of Passau,Faculty of Computer Science and Mathematics,Passau,Germany,94032"}]},{"given":"Nico","family":"Mexis","sequence":"additional","affiliation":[{"name":"University of Passau,Faculty of Computer Science and Mathematics,Passau,Germany,94032"}]},{"given":"Yufan","family":"Fan","sequence":"additional","affiliation":[{"name":"Technical University of Darmstadt,Department of Electrical Engineering and Information Technology,Darmstadt,Germany,64283"}]},{"given":"Stephanie Senjuty","family":"Bartsch","sequence":"additional","affiliation":[{"name":"Technical University of Darmstadt,Department of Computer Science,Darmstadt,Germany,64289"}]},{"given":"Tanja","family":"Schaier","sequence":"additional","affiliation":[{"name":"University of Passau,Faculty of Computer Science and Mathematics,Passau,Germany,94032"}]},{"given":"Stefan","family":"Katzenbeisser","sequence":"additional","affiliation":[{"name":"University of Passau,Faculty of Computer Science and Mathematics,Passau,Germany,94032"}]},{"given":"Tolga","family":"Arul","sequence":"additional","affiliation":[{"name":"University of Passau,Faculty of Computer Science and Mathematics,Passau,Germany,94032"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/autest.2010.5613564"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/app12094332"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/iemdc.2017.8002341"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2023.114940"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-023-02168-6"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/proc.1974.9409"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2742060.2742069"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2017.8050629"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s19112428"},{"key":"ref10","first-page":"432","article-title":"Run-time accessible DRAM PUFs in commodity devices","volume":"9813","author":"Xiong","year":"2016","journal-title":"Cryptographic Hardware and Embedded Systems \u2013 CHES 2016, ser. Lectures Notes in Computer Science"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/giis.2018.8635789"},{"key":"ref12","doi-asserted-by":"crossref","DOI":"10.21203\/rs.3.rs-3341376\/v1","article-title":"Analyzing aging effects on SRAM PUFs: Implications for security and reliability","author":"Bhatta","year":"2023"},{"volume-title":"An investigation of the effects of temperature-based aging on DRAM retention-based PUFs","year":"2019","author":"Senjuty Bartsch","key":"ref13"},{"volume-title":"Auswirkung k\u00fcnstlicher Alterung auf den DRAM PUF","year":"2022","author":"Schaier","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc.2012.6341361"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2005.04.053"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/led.2009.2020308"},{"year":"2015","key":"ref18","article-title":"Reliability Report 58 2H 2014"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3458824"}],"event":{"name":"2024 IEEE International Conference on Consumer Electronics (ICCE)","start":{"date-parts":[[2024,1,6]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2024,1,8]]}},"container-title":["2024 IEEE International Conference on Consumer Electronics (ICCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10444098\/10444131\/10444494.pdf?arnumber=10444494","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:41:55Z","timestamp":1709253715000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10444494\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,1,6]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/icce59016.2024.10444494","relation":{},"subject":[],"published":{"date-parts":[[2024,1,6]]}}}