{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T16:41:08Z","timestamp":1743093668673,"version":"3.40.3"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,1,11]],"date-time":"2025-01-11T00:00:00Z","timestamp":1736553600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,11]],"date-time":"2025-01-11T00:00:00Z","timestamp":1736553600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,1,11]]},"DOI":"10.1109\/icce63647.2025.10929849","type":"proceedings-article","created":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T02:16:58Z","timestamp":1743041818000},"page":"1-3","source":"Crossref","is-referenced-by-count":0,"title":["Radiation Degradation Evaluation of the Dynamic Configuration Circuit on An Optically Reconfigurable Gate Array VLSI"],"prefix":"10.1109","author":[{"given":"Seiji","family":"Ohashi","sequence":"first","affiliation":[{"name":"Okayama University,Information Technology Track, Information Technology, Electrical Engineering, and Mathematical and Data Sciences Program, Faculty of Engineering,Kita-ku, Okayama,Japan,700-8530"}]},{"given":"Minoru","family":"Watanabe","sequence":"additional","affiliation":[{"name":"Okayama University,Information Technology Track, Information Technology, Electrical Engineering, and Mathematical and Data Sciences Program, Faculty of Engineering,Kita-ku, Okayama,Japan,700-8530"}]},{"given":"Nobuya","family":"Watanabe","sequence":"additional","affiliation":[{"name":"Okayama University,Information Technology Track, Information Technology, Electrical Engineering, and Mathematical and Data Sciences Program, Faculty of Engineering,Kita-ku, Okayama,Japan,700-8530"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS55911.2022.10412440"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1364\/oe.500666"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOT.2020.3038900"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1364\/AO.396525"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1364\/ao.57.008625"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.028136"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.15224\/978-1-63248-109-2-37"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1364\/osac.415702"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/socc46988.2019.1570548505"}],"event":{"name":"2025 IEEE International Conference on Consumer Electronics (ICCE)","start":{"date-parts":[[2025,1,11]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2025,1,14]]}},"container-title":["2025 IEEE International Conference on Consumer Electronics (ICCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10929765\/10929768\/10929849.pdf?arnumber=10929849","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T15:37:22Z","timestamp":1743089842000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10929849\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1,11]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/icce63647.2025.10929849","relation":{},"subject":[],"published":{"date-parts":[[2025,1,11]]}}}