{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,12,13]],"date-time":"2024-12-13T05:19:20Z","timestamp":1734067160912,"version":"3.30.2"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,11]],"date-time":"2024-10-11T00:00:00Z","timestamp":1728604800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,11]],"date-time":"2024-10-11T00:00:00Z","timestamp":1728604800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,11]]},"DOI":"10.1109\/icceic64099.2024.10775901","type":"proceedings-article","created":{"date-parts":[[2024,12,11]],"date-time":"2024-12-11T22:21:58Z","timestamp":1733955718000},"page":"21-24","source":"Crossref","is-referenced-by-count":0,"title":["The Lightweight Steel Surface Defect Detection Algorithm Based on YOLO-ETG"],"prefix":"10.1109","author":[{"given":"Hui","family":"Cheng","sequence":"first","affiliation":[{"name":"College of Information Engineering, Dalian University,Dalian,China,116000"}]},{"given":"Chunling","family":"Liu","sequence":"additional","affiliation":[{"name":"College of Information Engineering, Dalian University,Dalian,China,116000"}]}],"member":"263","reference":[{"issue":"11","key":"ref1","first-page":"107","article-title":"Lightweight Steel Surface Defect Detection Based on the YOLO-GR Algorithm","author":"Yawei","year":"2023","journal-title":"*Combined Machine Tools and Automation Processing Technology*"},{"issue":"15","key":"ref2","first-page":"318","article-title":"-YOLO for Steel Surface Defect Detection in Complex Environments","volume":"59","author":"Junzhe","year":"2023","journal-title":"*Computer Engineering and Applications*"},{"issue":"S2","key":"ref3","first-page":"271","article-title":"Improved Lightweight Steel Surface Defect Detection Model Based on YOLOv5s","volume":"50","author":"Bo","year":"2023","journal-title":"*Computer Science*"},{"key":"ref4","first-page":"11946","article-title":"Efficientnet: Rethinking model scaling for convolutional neural networks[J]","author":"Tan","year":"1905","journal-title":"arXiv preprint"},{"issue":"05","key":"ref5","first-page":"106","article-title":"PCB Surface Defect Detection Based on Improved YOLOv5","author":"Shuqing","year":"2023","journal-title":"*Instrument Technology and Sensor*"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/WACV48630.2021.00318"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/CVPR42600.2020.00165"},{"key":"ref8","article-title":"Wise-IoU: bounding box regression loss with dynamic focusing mechanism [J]","author":"Tong","year":"2023","journal-title":"arXiv preprint"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1016\/j.apsusc.2013.09.002"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/icassp39728.2021.9414568"},{"key":"ref11","article-title":"NAM: Normalization-based attention module[J]","author":"Liu","year":"2021","journal-title":"arXiv preprint"}],"event":{"name":"2024 5th International Conference on Computer Engineering and Intelligent Control (ICCEIC)","start":{"date-parts":[[2024,10,11]]},"location":"Guangzhou, China","end":{"date-parts":[[2024,10,13]]}},"container-title":["2024 5th International Conference on Computer Engineering and Intelligent Control (ICCEIC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10774577\/10775297\/10775901.pdf?arnumber=10775901","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,12]],"date-time":"2024-12-12T07:28:50Z","timestamp":1733988530000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10775901\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,11]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/icceic64099.2024.10775901","relation":{},"subject":[],"published":{"date-parts":[[2024,10,11]]}}}