{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T20:56:46Z","timestamp":1730235406943,"version":"3.28.0"},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,9,26]]},"DOI":"10.1109\/iccicc50026.2020.9450251","type":"proceedings-article","created":{"date-parts":[[2021,6,14]],"date-time":"2021-06-14T20:42:15Z","timestamp":1623703335000},"page":"60-67","source":"Crossref","is-referenced-by-count":1,"title":["A Deep Learning-Based Approach for Quality Control and Defect Detection for Industrial Bagging Systems"],"prefix":"10.1109","author":[{"given":"Mathieu","family":"Juncker","sequence":"first","affiliation":[]},{"given":"Ismail","family":"Khriss","sequence":"additional","affiliation":[]},{"given":"Jean","family":"Brousseau","sequence":"additional","affiliation":[]},{"given":"Steven","family":"Pigeon","sequence":"additional","affiliation":[]},{"given":"Alexis","family":"Darisse","sequence":"additional","affiliation":[]},{"given":"Billy","family":"Lapointe","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.cogsys.2018.12.007"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.bbe.2018.10.007"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.future.2018.03.023"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2016.04.072"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s13244-018-0639-9"},{"key":"ref15","article-title":"An Architecture Combining Convolutional Neural Network (CNN) and Support Vector Machine (SVM) for Image Classification","volume":"abs 1712 3541","author":"agarap","year":"2017","journal-title":"CoRR"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s40846-016-0182-4"},{"journal-title":"Support Vector Machines","year":"2008","author":"steinwart","key":"ref17"},{"key":"ref18","article-title":"Deep Learning using Linear Support Vector Machines","volume":"abs 1306 239","author":"tang","year":"2013","journal-title":"CoRR"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"580","DOI":"10.1109\/CVPR.2014.81","article-title":"Rich Feature Hierarchies for Accurate Object Detection and Semantic Segmentation","author":"girshick","year":"2014","journal-title":"2014 IEEE Conference on Computer Vision and Pattern Recognition"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2017.2668395"},{"key":"ref3","article-title":"Contrôle. Qualité","volume":"base documentaire tib352duo","author":"pierre","year":"1997","journal-title":"Techniques de l'ingénieur Fonderies et moulages aspects généraux Article de base documentaire"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.25165\/j.ijabe.20181104.4475"},{"journal-title":"AI in manufacturing operations","year":"2019","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/EUSIPCO.2018.8553156"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.10.070"},{"key":"ref2","article-title":"Contrôle non destructif (CND)","volume":"base documentaire tib585duo","author":"jacques","year":"1996","journal-title":"Techniques de l'ingénieur CND méthodes globales et volumiques Article de base documentaire"},{"key":"ref1","article-title":"Détection des corps étrangers dans les produits alimentaires","author":"fran\u00e7ois","year":"2007","journal-title":"(in fre) Techniques de l'ingénieur Agroalimentaire risques et sécurité Article de base documentaire TIB427DUO"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1111\/mice.12334"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.169"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.195"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2577031"},{"journal-title":"Adam A method for stochastic optimization","year":"2015","author":"lei ba","key":"ref23"}],"event":{"name":"2020 IEEE 19th International Conference on Cognitive Informatics & Cognitive Computing (ICCI*CC)","start":{"date-parts":[[2020,9,26]]},"location":"Beijing, China","end":{"date-parts":[[2020,9,28]]}},"container-title":["2020 IEEE 19th International Conference on Cognitive Informatics & Cognitive Computing (ICCI*CC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9450047\/9450212\/09450251.pdf?arnumber=9450251","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,8,30]],"date-time":"2021-08-30T22:46:04Z","timestamp":1630363564000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9450251\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9,26]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/iccicc50026.2020.9450251","relation":{},"subject":[],"published":{"date-parts":[[2020,9,26]]}}}