{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T19:59:58Z","timestamp":1780343998885,"version":"3.54.1"},"reference-count":30,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/iccp.2017.8116997","type":"proceedings-article","created":{"date-parts":[[2017,11,23]],"date-time":"2017-11-23T22:02:46Z","timestamp":1511474566000},"page":"147-154","source":"Crossref","is-referenced-by-count":41,"title":["Machine learning for sensor-based manufacturing processes"],"prefix":"10.1109","author":[{"given":"Dorin","family":"Moldovan","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tudor","family":"Cioara","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ionut","family":"Anghel","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ioan","family":"Salomie","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref30","year":"0"},{"key":"ref10","first-page":"1","author":"branco","year":"2015","journal-title":"A survey of predictive modelling under imbalanced distributions"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2008.239"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSE.2013.6553890"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"1","DOI":"10.18637\/jss.v036.i11","article-title":"Feature selection with the boruta package","volume":"36","author":"kursa","year":"2010","journal-title":"Journal of Statistical Software"},{"key":"ref14","first-page":"17","article-title":"Feature selection using multivariate adaptive regression splines","volume":"8","author":"kumar","year":"2016","journal-title":"International Journal of Research and Reviews in Applied Sciences And Engineering IIJRRASE)"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.11613\/BM.2014.003"},{"key":"ref16","article-title":"A cuda implementation of random forests - early results","author":"grahn","year":"2010","journal-title":"Third Swedish Workshop on Multi-core Computing"},{"key":"ref17","first-page":"161","article-title":"An empirical comparison of supervised learning algorithms using different performance metrics","author":"caruana","year":"2005","journal-title":"Proc 23 rd Intl Conf Machine learning (ICML06"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"1","DOI":"10.5121\/ijdkp.2015.5201","article-title":"A review on evaluation metrics for data classification evaluations","volume":"5","author":"hossin","year":"2015","journal-title":"International Journal of Data Mining & Knowledge Management Process (IJDKP)"},{"key":"ref19","author":"lichman","year":"2013","journal-title":"UCI Machine Learning Repository"},{"key":"ref28","author":"steiger","year":"2015","journal-title":"Principal Components Analysis"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3844\/ajeassp.2015.223.232"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1214\/09-SS054"},{"key":"ref3","first-page":"14","article-title":"New controller extends lifetime of 200mm tools","volume":"8","author":"dietz","year":"2013","journal-title":"Nanochip Fab Solutions"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.cad.2014.07.006"},{"key":"ref29","first-page":"10","article-title":"Weka powerful tool in data mining","author":"kulkarni","year":"2016","journal-title":"International Journal of Computer Applications"},{"key":"ref5","first-page":"1","article-title":"Big data and analytics for semiconductor manufacturing","author":"hattori","year":"2013","journal-title":"Technical Report IBM"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s13748-015-0080-y"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/asv021"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2016.11.047"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1515\/9781400874668"},{"key":"ref1","first-page":"46","article-title":"Big data and the opportunities it creates for semiconductor players","author":"bauer","year":"2012","journal-title":"McKinsey on Semiconductors"},{"key":"ref20","article-title":"Analysis of data from a semi-conductor manufacturing process using different classification models and principal component analysis","author":"kumaran","year":"2014","journal-title":"Texas A&M University Technical Report"},{"key":"ref22","first-page":"2533","article-title":"Weka-experiences with a java open-source project","volume":"11","author":"bouckaert","year":"2010","journal-title":"Journal of Machine Learning"},{"key":"ref21","article-title":"Feature selection and boosting techniques to improve fault detection accuracy in the semiconductor manufacturing process","volume":"1","author":"kerdprasop","year":"2011","journal-title":"Proceedings of the International MultiConference of Engineers and Computer Scientists"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.14257\/astl.2016.133.15"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.7763\/IJET.2016.V8.898"},{"key":"ref26","first-page":"198","article-title":"A study on effects of intrinsic characteristics of datasets on classification performance","volume":"6","author":"kaveri sharma*","year":"2016","journal-title":"International Journal of Advanced Research in Computer Science and Software Engineering"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.5430\/air.v4n1p22"}],"event":{"name":"2017 13th IEEE International Conference on Intelligent Computer Communication and Processing (ICCP)","location":"Cluj-Napoca","start":{"date-parts":[[2017,9,7]]},"end":{"date-parts":[[2017,9,9]]}},"container-title":["2017 13th IEEE International Conference on Intelligent Computer Communication and Processing (ICCP)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8103830\/8116963\/08116997.pdf?arnumber=8116997","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,6]],"date-time":"2019-10-06T18:29:40Z","timestamp":1570386580000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8116997\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/iccp.2017.8116997","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}