{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T21:00:16Z","timestamp":1730235616002,"version":"3.28.0"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,9,3]],"date-time":"2020-09-03T00:00:00Z","timestamp":1599091200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,9,3]],"date-time":"2020-09-03T00:00:00Z","timestamp":1599091200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,9,3]],"date-time":"2020-09-03T00:00:00Z","timestamp":1599091200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,9,3]]},"DOI":"10.1109\/iccp51029.2020.9266269","type":"proceedings-article","created":{"date-parts":[[2020,11,26]],"date-time":"2020-11-26T21:23:22Z","timestamp":1606425802000},"page":"563-570","source":"Crossref","is-referenced-by-count":10,"title":["Particle Swarm Optimization Based Deep Learning Ensemble for Manufacturing Processes"],"prefix":"10.1109","author":[{"given":"Dorin","family":"Moldovan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ionut","family":"Anghel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tudor","family":"Cioara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ioan","family":"Salomie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-58967-1_5"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2018.03.264"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-22784-5_16"},{"key":"ref12","first-page":"1","article-title":"Optimization of ensemble based decision using pso","volume":"1","author":"kausar","year":"2010","journal-title":"Proceedings of the World Congress on Engineering"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2926444"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.advengsoft.2015.01.010"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.advengsoft.2016.01.008"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.advengsoft.2013.12.007"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICCP.2017.8116997"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/EUC.2018.00012"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ROEDUNET.2018.8514152"},{"journal-title":"UCI Machine Learning Repository","year":"2017","author":"dua","key":"ref28"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.promfg.2020.02.037"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEVC.2015.2503422"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10696-012-9165-0"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2016.05.027"},{"journal-title":"Machine Learning Challenges","year":"0","key":"ref29"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2018.01.003"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.swevo.2011.05.003"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2733438"},{"journal-title":"Technical committee for semiconductor manufacturing automation","year":"0","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2018.12.012"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/ajim.4700110209"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-019-09718-3"},{"key":"ref22","first-page":"1","article-title":"Feature selection and boosting techniques to improve fault detection accuracy in the semiconductor manufacturing process","author":"kerdprasop","year":"2011","journal-title":"Proceedings of the International Multi Conference of Engineers and Computer Scientists"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/bdcc2040030"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CompComm.2017.8322951"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.7763\/IJET.2016.V8.898"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/cem.750"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2018.2881286"}],"event":{"name":"2020 IEEE 16th International Conference on Intelligent Computer Communication and Processing (ICCP)","start":{"date-parts":[[2020,9,3]]},"location":"Cluj-Napoca, Romania","end":{"date-parts":[[2020,9,5]]}},"container-title":["2020 IEEE 16th International Conference on Intelligent Computer Communication and Processing (ICCP)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9266025\/9266027\/09266269.pdf?arnumber=9266269","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T00:24:58Z","timestamp":1656375898000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9266269\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9,3]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/iccp51029.2020.9266269","relation":{},"subject":[],"published":{"date-parts":[[2020,9,3]]}}}