{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T20:54:29Z","timestamp":1773694469028,"version":"3.50.1"},"reference-count":50,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T00:00:00Z","timestamp":1760572800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T00:00:00Z","timestamp":1760572800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,16]]},"DOI":"10.1109\/iccp68926.2025.11427150","type":"proceedings-article","created":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T19:51:37Z","timestamp":1773431497000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Improving Integrated Circuit Manufacturing Flow Through Machine Learning: A Focus on Pre-Silicon Verification"],"prefix":"10.1109","author":[{"given":"Alecsandra","family":"Rusu","sequence":"first","affiliation":[{"name":"Technical University of Cluj-Napoca,Department of Basis of Electronics,Cluj-Napoca,Romania"}]},{"given":"Marius","family":"Neag","sequence":"additional","affiliation":[{"name":"Technical University of Cluj-Napoca,Department of Basis of Electronics,Cluj-Napoca,Romania"}]},{"given":"Marina","family":"Topa","sequence":"additional","affiliation":[{"name":"Technical University of Cluj-Napoca,Department of Basis of Electronics,Cluj-Napoca,Romania"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.fmre.2024.09.009"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tsm.2010.2096437"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1093\/nsr\/nwae008"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691110"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-2269-3_4"},{"key":"ref6","article-title":"Physics-Informed Machine Learning: A Survey","author":"Hao","year":"2022","journal-title":"arXiv preprint arXiv:2211.08064"},{"issue":"1","key":"ref7","article-title":"Advancements in Machine Learning: A Comprehensive Review of Algorithms, Applications, and Future Directions","volume":"2","author":"Mule","year":"2025","journal-title":"Recent Trends in Programming Languages"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1201\/b19714"},{"key":"ref9","article-title":"Electronic Design Automation: Synthesis, Verification, and Test","volume-title":"Morgan Kaufmann","author":"Wang"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2022.109987"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714724"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2014.6974668"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/access.2023.3322358"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/smacd.2019.8795266"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/dcis51330.2020.9268659"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/isfee.2018.8742436"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/smacd61181.2024.10745402"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/smacd61181.2024.10745387"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/isscs58449.2023.10190850"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.112"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/isscs58449.2023.10190853"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN55064.2022.9891914"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/HPEC.2019.8916327"},{"key":"ref24","article-title":"Essential Electronic Design Automation (EDA)","volume-title":"Prentice Hall","author":"Birnbaum"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/electronics13132600"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/access.2024.3463393"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/iolts60994.2024.10616057"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s11831-020-09474-6"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/3451179"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2006.05.023"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.7551\/mitpress\/3206.001.0001"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4302-5990-9_4"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1201\/9781315370279"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2014.6853587"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176347963"},{"key":"ref36","article-title":"Machine learning benchmarks and random forest regression","author":"Segal","year":"2004"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1021\/ac048561m"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2017.04.018"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1029\/2004WR003782"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.3390\/data7040046"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1017\/9781108348973"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1002\/0470013192.bsa526"},{"key":"ref43","first-page":"288","article-title":"A Characterization of Mean Squared Error for Estimator with Bagging","volume-title":"Proc. Int. Conf. Artificial Intelligence and Statistics","volume":"108","author":"Mihelich"},{"key":"ref44","article-title":"Performance Metrics (Error Measures) in Machine Learning Regression, Forecasting and Prognostics: Properties and Typology","author":"Botchkarev","year":"2018","journal-title":"arXiv preprint arXiv:1809.03006"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1121\/1.1764831"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/tsp.2020.2993164"},{"key":"ref47","article-title":"Empirical Risk Minimization Is Consistent with the Mean Absolute Percentage Error","author":"De Myttenaere","year":"2015","journal-title":"arXiv preprint arXiv:1509.02357"},{"key":"ref48","first-page":"229","article-title":"Introduction to the Theory of Statistics","author":"Mood","year":"1974"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCS58449.2023.10190907"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1007\/s11081-017-9366-1"}],"event":{"name":"2025 IEEE 21st International Conference on Intelligent Computer Communication and Processing (ICCP)","location":"Cluj-Napoca, Romania","start":{"date-parts":[[2025,10,16]]},"end":{"date-parts":[[2025,10,18]]}},"container-title":["2025 IEEE 21st International Conference on Intelligent Computer Communication and Processing (ICCP)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11427093\/11427059\/11427150.pdf?arnumber=11427150","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T20:10:31Z","timestamp":1773691831000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11427150\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,16]]},"references-count":50,"URL":"https:\/\/doi.org\/10.1109\/iccp68926.2025.11427150","relation":{},"subject":[],"published":{"date-parts":[[2025,10,16]]}}}