{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T06:12:55Z","timestamp":1729663975578,"version":"3.28.0"},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/icecs.2004.1399748","type":"proceedings-article","created":{"date-parts":[[2005,3,31]],"date-time":"2005-03-31T18:26:51Z","timestamp":1112293611000},"page":"583-586","source":"Crossref","is-referenced-by-count":2,"title":["Fast high-level fault simulator"],"prefix":"10.1109","author":[{"given":"S.","family":"Deniziak","sequence":"first","affiliation":[]},{"given":"K.","family":"Sapiecha","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639688"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2000.889551"},{"key":"17","first-page":"825","article-title":"RT-level fault simulation techniques based on simulation command scripts","author":"corno","year":"2000","journal-title":"Proc Integrated Circuits and Systems Design"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1972.223542"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840301"},{"key":"15","first-page":"968","article-title":"B-algorithm: A behavioral test generation algorithm","author":"cho","year":"1994","journal-title":"Proc of the International Test Conference"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766684"},{"key":"13","first-page":"616","article-title":"A parallel algorithm for fault simulation based on PROOFS","author":"pakers","year":"1995","journal-title":"Proc IEEE Int Conf Computer Design"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1007\/BF00137390"},{"key":"11","doi-asserted-by":"crossref","first-page":"1048","DOI":"10.1109\/43.536711","article-title":"HOPE: An efficient parallel fault simulator for synchronous sequential circuits","volume":"15","author":"lee","year":"1996","journal-title":"IEEE Trans on computer-aided design of integrated circuits and system"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.1997.568204"},{"key":"21","first-page":"260","article-title":"A fault simulation based test pattern generator for synchronous sequential circuits","author":"guo","year":"1999","journal-title":"Proc of the VLSI Test Symposium"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/54.867894"},{"key":"20","first-page":"273","article-title":"An interpretation framework for evaluating high-level fault models and ATPG capabilities","author":"corno","year":"2001","journal-title":"Proc Symp Integr Circuits Syst Design"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843872"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/6.774966"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.1998.814866"},{"key":"7","first-page":"416","article-title":"Experimental analysis of fault models for behavioral-level test generation","author":"goloubeva","year":"2002","journal-title":"Proc IEEE Conf Design and Diagnostics of Electronics Circuits and Systems"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/43.936381"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743202"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270851"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/2.920617"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915056"}],"event":{"name":"2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004.","location":"Tel Aviv, Israel"},"container-title":["Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9627\/30421\/01399748.pdf?arnumber=1399748","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T17:51:07Z","timestamp":1497635467000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1399748\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/icecs.2004.1399748","relation":{},"subject":[]}}