{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T05:36:23Z","timestamp":1729661783581,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/icecs.2004.1399759","type":"proceedings-article","created":{"date-parts":[[2005,3,31]],"date-time":"2005-03-31T13:26:51Z","timestamp":1112275611000},"page":"627-630","source":"Crossref","is-referenced-by-count":0,"title":["Adaptive analog-to-digital conversion using self-dithering in data acquisition systems"],"prefix":"10.1109","author":[{"given":"J.M.D.","family":"Pereira","sequence":"first","affiliation":[]},{"given":"P.S.","family":"Girao","sequence":"additional","affiliation":[]},{"given":"O.","family":"Postolache","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.1997.604026"},{"journal-title":"Compatibility of Analog Signals for Electronic Industrial Process Instruments","year":"1982","key":"11"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/19.585437"},{"journal-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters","year":"2000","key":"3"},{"key":"2","article-title":"Dithered quantizing systems","author":"petri","year":"1996","journal-title":"Proc Int Workshop ADC Modelling"},{"journal-title":"Oversampling Delta-Sigma Data Converters - Theory Design and Simulation","year":"1992","author":"candy","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/19.293410"},{"key":"7","doi-asserted-by":"crossref","first-page":"389","DOI":"10.1109\/19.293456","article-title":"Effect of additive dither on the resolution of ideal quantizers","volume":"43","author":"petri","year":"1994","journal-title":"IEEE Trans on Instr and Meas"},{"key":"6","first-page":"287","article-title":"Dithered quantizer of ADC plug-in card: Theoretical model and practical testing","volume":"ivb","author":"holub","year":"1997","journal-title":"Imeko World Congr"},{"journal-title":"IEEE Standard for Digitizing Waveform Recorders","year":"1994","key":"5"},{"key":"4","first-page":"103","article-title":"Flexible ADC: A dither and oversampling based solution to improve the performance of ADC systems","volume":"2","author":"pereira","year":"2000","journal-title":"Proc Imeko World Congress"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/18.59924"},{"key":"8","first-page":"103","article-title":"Flexible ADC: A dither and oversampling based solution to improve the performance of ADC systems","volume":"2","author":"pereira","year":"2000","journal-title":"Proc Imeko World Congress"}],"event":{"name":"2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004.","location":"Tel Aviv, Israel"},"container-title":["Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9627\/30421\/01399759.pdf?arnumber=1399759","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T13:51:07Z","timestamp":1497621067000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1399759\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/icecs.2004.1399759","relation":{},"subject":[]}}