{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T14:43:14Z","timestamp":1774968194279,"version":"3.50.1"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2007,12,1]],"date-time":"2007-12-01T00:00:00Z","timestamp":1196467200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2007,12,1]],"date-time":"2007-12-01T00:00:00Z","timestamp":1196467200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,12]]},"DOI":"10.1109\/icecs.2007.4511019","type":"proceedings-article","created":{"date-parts":[[2008,5,5]],"date-time":"2008-05-05T16:21:05Z","timestamp":1210004465000},"page":"419-422","source":"Crossref","is-referenced-by-count":6,"title":["Behavioral Modeling of The pH-ISFET Temperature Influence"],"prefix":"10.1109","author":[{"given":"B.","family":"Hajji","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, ENSA - Mohammed 1 st University, Oujda, Morocco. bhajji@ensa.ump.ma"}]},{"given":"S. E.","family":"Naimi","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, ENSA - Mohammed 1 st University, Oujda, Morocco. snaimi@ensa.ump.ma"}]},{"given":"I.","family":"Humenyuk","sequence":"additional","affiliation":[{"name":"\"Microdevices and microsystems of detection\" Group, LAAS-CNRS, University of Toulouse, Toulouse, France"}]},{"given":"J.","family":"Launay","sequence":"additional","affiliation":[{"name":"\"Microdevices and microsystems of detection\" Group, LAAS-CNRS, University of Toulouse, Toulouse, France"}]},{"given":"P.","family":"Temple-Boyer","sequence":"additional","affiliation":[{"name":"\"Microdevices and microsystems of detection\" Group, LAAS-CNRS, University of Toulouse, Toulouse, France"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(98)00157-9"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(01)00639-6"},{"key":"ref6","first-page":"10","author":"koryta","year":"1993","journal-title":"Principles of Electrochemistry"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/0250-6874(87)80002-1"},{"key":"ref8","first-page":"591","author":"annamalai","year":"2002","journal-title":"Advanced Engineering Thermodynamics"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0254-0584(99)00033-4"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/0925-4005(94)87084-5"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/0471474908"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(02)00301-5"}],"event":{"name":"2007 14th IEEE International Conference on Electronics, Circuits and Systems","location":"Marrakech, Morocco","start":{"date-parts":[[2007,12,11]]},"end":{"date-parts":[[2007,12,14]]}},"container-title":["2007 14th IEEE International Conference on Electronics, Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4456901\/4510892\/04511019.pdf?arnumber=4511019","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T20:20:33Z","timestamp":1773778833000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/4511019\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,12]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/icecs.2007.4511019","relation":{},"subject":[],"published":{"date-parts":[[2007,12]]}}}