{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T00:06:40Z","timestamp":1773792400452,"version":"3.50.1"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2007,12,1]],"date-time":"2007-12-01T00:00:00Z","timestamp":1196467200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2007,12,1]],"date-time":"2007-12-01T00:00:00Z","timestamp":1196467200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,12]]},"DOI":"10.1109\/icecs.2007.4511023","type":"proceedings-article","created":{"date-parts":[[2008,5,5]],"date-time":"2008-05-05T16:21:05Z","timestamp":1210004465000},"page":"435-438","source":"Crossref","is-referenced-by-count":2,"title":["Testing of Level Shifters in Multiple Voltage Designs"],"prefix":"10.1109","author":[{"given":"Noohul Basheer","family":"Zain Ali","sequence":"first","affiliation":[{"name":"Electronic System Design Group, School of Electronics and Computer Science University of Southampton. nbza104r@ecs.soton.ac.uk"}]},{"given":"Mark","family":"Zwolinski","sequence":"additional","affiliation":[{"name":"Electronic System Design Group, School of Electronics and Computer Science University of Southampton. mz@ecs.soton.ac.uk"}]},{"given":"Bashir M","family":"Al-Hashimi","sequence":"additional","affiliation":[{"name":"Electronic System Design Group, School of Electronics and Computer Science University of Southampton. bmah@ecs.soton.ac.uk"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2005.1502637"},{"key":"ref3","first-page":"1530","article-title":"Dynamic voltage scaling aware delay fault testing","author":"ali","year":"2006","journal-title":"Test Symposium 2006 ETS '06 Eleventh IEEE European"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512635"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2006.24"},{"key":"ref7","first-page":"767","article-title":"Fault coverage analysis for physically-based cmos bridging faults at different power supply voltages","author":"liao","year":"1996","journal-title":"Proceedings ITC"},{"key":"ref2","year":"2002","journal-title":"Crusoe processor documentation Transmeta Corporation"},{"key":"ref1","year":"2006","journal-title":"Intel XScale Core Developers Manual 2003"}],"event":{"name":"2007 14th IEEE International Conference on Electronics, Circuits and Systems","location":"Marrakech, Morocco","start":{"date-parts":[[2007,12,11]]},"end":{"date-parts":[[2007,12,14]]}},"container-title":["2007 14th IEEE International Conference on Electronics, Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4456901\/4510892\/04511023.pdf?arnumber=4511023","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T20:21:16Z","timestamp":1773778876000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/4511023\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,12]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/icecs.2007.4511023","relation":{},"subject":[],"published":{"date-parts":[[2007,12]]}}}