{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T22:15:21Z","timestamp":1730240121826,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,12]]},"DOI":"10.1109\/icecs.2010.5724589","type":"proceedings-article","created":{"date-parts":[[2011,3,8]],"date-time":"2011-03-08T06:27:36Z","timestamp":1299565656000},"page":"623-626","source":"Crossref","is-referenced-by-count":0,"title":["Estimating design quality of digital systems via machine learning"],"prefix":"10.1109","author":[{"given":"Qi","family":"Guo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tianshi","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haihua","family":"Shen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yunji","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.70722"},{"key":"ref3","first-page":"227","article-title":"An objective measure of digital system design quality\/","year":"2000","journal-title":"Proc Int Symposium on Quality Electron Design"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2005.112"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"2","DOI":"10.1109\/TSE.2007.256941","article-title":"Data mining static code attributes to learn defect predictor\/","volume":"33","author":"greenwald","year":"2007","journal-title":"IEEE Trans Softw Eng"},{"year":"1997","author":"mitchell","key":"ref8"},{"journal-title":"Applied multivariate statistical analysis","year":"1998","author":"johnson","key":"ref7"},{"key":"ref2","first-page":"389","article-title":"Design quality and design efficiency; definitions, metrics and relevant design experiences\/","year":"2000","journal-title":"Proc oflnternational Symposium on Quality Electronic Desig"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s11390-005-0243-6"}],"event":{"name":"2010 17th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2010)","start":{"date-parts":[[2010,12,12]]},"location":"Athens","end":{"date-parts":[[2010,12,15]]}},"container-title":["2010 17th IEEE International Conference on Electronics, Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5720492\/5724436\/05724589.pdf?arnumber=5724589","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,2,7]],"date-time":"2020-02-07T02:26:23Z","timestamp":1581042383000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5724589\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,12]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/icecs.2010.5724589","relation":{},"subject":[],"published":{"date-parts":[[2010,12]]}}}