{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T07:56:20Z","timestamp":1725522980001},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,12]]},"DOI":"10.1109\/icecs.2011.6122240","type":"proceedings-article","created":{"date-parts":[[2012,1,11]],"date-time":"2012-01-11T22:00:31Z","timestamp":1326319231000},"page":"165-168","source":"Crossref","is-referenced-by-count":0,"title":["Assessing testing techniques for resistive-open defects in nanometer CMOS adders"],"prefix":"10.1109","author":[{"given":"Ahmed","family":"Fawaz","sequence":"first","affiliation":[]},{"given":"Ameen","family":"Jaber","sequence":"additional","affiliation":[]},{"given":"Ali","family":"Kassem","sequence":"additional","affiliation":[]},{"given":"Ali","family":"Chehab","sequence":"additional","affiliation":[]},{"given":"Ayman","family":"Kayssi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","first-page":"57","article-title":"Statistical Threshold Formulation for Dynamic Idd Test","author":"jiang","year":"1999","journal-title":"Int Test Conf"},{"key":"22","article-title":"IDDT Testing: An Efficient Method for Detecting Delay Faults and Open Defects","author":"ishida","year":"0","journal-title":"IEEE International Workshop on Defect Based Testing Los Angeles CA USA April 2001"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805613"},{"key":"23","article-title":"IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits","author":"chehab","year":"0","journal-title":"1st International Workshop on Electronic Design Test & Applications (DELTA 2000) January 2002"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-006-9318-8"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805801"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/DBT.2005.1531303"},{"journal-title":"International Technology Roadmap for Semiconductors","year":"0","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805800"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519745"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/APCCAS.2010.5774897"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805615"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/996566.996695"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/ASEMD.2009.5306676"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012650"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998474"},{"journal-title":"Process Variation Aware Synthesis of Nano-CMOS Circuits","year":"0","author":"pradhan","key":"10"},{"key":"7","first-page":"378","article-title":"Iddt Testing","author":"min","year":"0","journal-title":"Test Symposium 1997 (ATS '97) Proceedings Sixth Asian"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852674"},{"key":"5","article-title":"Iddt Testing: An Efficient Method for Detecting Delay Faults and Open Defects","author":"ishida","year":"0","journal-title":"Proc IEEE Intl Workshop on Defect Based Testing Marina del Rey CA 2001"},{"journal-title":"Testing Digital Circuits for Timing Failures by Output Waveform Analysis","year":"1994","author":"franco","key":"4"},{"journal-title":"Latest Models from Predictive Technology Model","year":"0","key":"9"},{"key":"8","first-page":"492","article-title":"Delay Test Simulation","author":"storey","year":"1977","journal-title":"Proc 14th Design Automation Conf"}],"event":{"name":"2011 18th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2011)","start":{"date-parts":[[2011,12,11]]},"location":"Beirut, Lebanon","end":{"date-parts":[[2011,12,14]]}},"container-title":["2011 18th IEEE International Conference on Electronics, Circuits, and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6111681\/6122192\/06122240.pdf?arnumber=6122240","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T16:38:04Z","timestamp":1490114284000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6122240\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,12]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/icecs.2011.6122240","relation":{},"subject":[],"published":{"date-parts":[[2011,12]]}}}