{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,5]],"date-time":"2025-06-05T06:45:45Z","timestamp":1749105945747},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,12]]},"DOI":"10.1109\/icecs.2013.6815442","type":"proceedings-article","created":{"date-parts":[[2014,5,16]],"date-time":"2014-05-16T19:05:07Z","timestamp":1400267107000},"page":"413-416","source":"Crossref","is-referenced-by-count":11,"title":["Impact of transistor aging on RF low noise amplifier performance of 28nm technology: Reliability assessment"],"prefix":"10.1109","author":[{"given":"Swaraj","family":"Mahato","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Georges","family":"Gielen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488856"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2011.2135470"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2008.06.016"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/4.568846"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1283780.1283821"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2007.4342682"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763239"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1049\/el.2010.1971"},{"key":"7","first-page":"1","article-title":"The NBTI impact on rf front end in wireless sensor networks","author":"bo","year":"2009","journal-title":"2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis CAS-ICTD"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.017"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2010.5619730"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2011.6044952"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2009.5424341"}],"event":{"name":"2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS)","start":{"date-parts":[[2013,12,8]]},"location":"Abu Dhabi, United Arab Emirates","end":{"date-parts":[[2013,12,11]]}},"container-title":["2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6810206\/6815321\/06815442.pdf?arnumber=6815442","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T18:46:06Z","timestamp":1490294766000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6815442\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,12]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/icecs.2013.6815442","relation":{},"subject":[],"published":{"date-parts":[[2013,12]]}}}