{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T03:03:55Z","timestamp":1729652635228,"version":"3.28.0"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,12]]},"DOI":"10.1109\/icecs.2013.6815466","type":"proceedings-article","created":{"date-parts":[[2014,5,16]],"date-time":"2014-05-16T19:05:07Z","timestamp":1400267107000},"page":"523-525","source":"Crossref","is-referenced-by-count":0,"title":["Nanotips characterization, modeling and simulation"],"prefix":"10.1109","author":[{"given":"Ahmed","family":"Ali","sequence":"first","affiliation":[]},{"given":"Hassan","family":"Barada","sequence":"additional","affiliation":[]},{"given":"Moh'd","family":"Rezeq","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2012.02.014"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511599842"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2198536"},{"key":"7","doi-asserted-by":"crossref","first-page":"348","DOI":"10.1016\/0039-6028(91)90437-W","article-title":"Derivation of the image interaction for non-planar pointed emitter geometries: Application to field emission I-V characteristics","volume":"246","author":"he","year":"1991","journal-title":"Surface Science"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/S0039-6028(02)02035-6"},{"journal-title":"Scanning Probe Microscopy","year":"2011","author":"tomczak","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2011.10.034"}],"event":{"name":"2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS)","start":{"date-parts":[[2013,12,8]]},"location":"Abu Dhabi, United Arab Emirates","end":{"date-parts":[[2013,12,11]]}},"container-title":["2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6810206\/6815321\/06815466.pdf?arnumber=6815466","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T09:22:09Z","timestamp":1498123329000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6815466\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,12]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/icecs.2013.6815466","relation":{},"subject":[],"published":{"date-parts":[[2013,12]]}}}