{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T05:29:04Z","timestamp":1725427744128},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,12]]},"DOI":"10.1109\/icecs.2013.6815516","type":"proceedings-article","created":{"date-parts":[[2014,5,16]],"date-time":"2014-05-16T23:05:07Z","timestamp":1400281507000},"page":"723-726","source":"Crossref","is-referenced-by-count":0,"title":["Variability analysis of a 28nm near-threshold synchronous voltage converter"],"prefix":"10.1109","author":[{"given":"Temesghen","family":"Tekeste","sequence":"first","affiliation":[]},{"given":"Ayman","family":"Shabra","sequence":"additional","affiliation":[]},{"given":"Duane","family":"Boning","sequence":"additional","affiliation":[]},{"given":"Ibramim","family":"Elfadel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228572"},{"key":"2","first-page":"1454","article-title":"Statistical modeling with the virtual source MOSFET model","author":"li","year":"2013","journal-title":"Proceedings of the Conference on Design Automation and Test in Europe EDA Consortium"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2043694"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2013.6487680"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/4.753687"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.821548"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1998.695026"}],"event":{"name":"2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS)","start":{"date-parts":[[2013,12,8]]},"location":"Abu Dhabi, United Arab Emirates","end":{"date-parts":[[2013,12,11]]}},"container-title":["2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6810206\/6815321\/06815516.pdf?arnumber=6815516","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T22:51:47Z","timestamp":1490309507000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6815516\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,12]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/icecs.2013.6815516","relation":{},"subject":[],"published":{"date-parts":[[2013,12]]}}}