{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T08:55:02Z","timestamp":1729673702693,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,12]]},"DOI":"10.1109\/icecs.2014.7050027","type":"proceedings-article","created":{"date-parts":[[2015,3,3]],"date-time":"2015-03-03T20:03:03Z","timestamp":1425412983000},"page":"482-485","source":"Crossref","is-referenced-by-count":3,"title":["Optimal programming with voltage-controlled temperature profile to reduce SET state distribution dispersion in PCM"],"prefix":"10.1109","author":[{"given":"A.","family":"Kiouseloglou","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Covi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Navarro","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Cabrini","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Perniola","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Torelli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"939","author":"ielmini","year":"2007","journal-title":"IEDM Tech Dig"},{"key":"ref3","first-page":"21.5.1","author":"navarro","year":"2013","journal-title":"IEDM Tech Dig"},{"key":"ref10","first-page":"1","author":"kostylev","year":"2008","journal-title":"Proc EPCOS"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.powtec.2005.04.010"},{"key":"ref11","first-page":"12.5.1","author":"li","year":"2011","journal-title":"IEDM Tech Dig"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2310497"},{"key":"ref8","first-page":"1017","author":"papandreou","year":"2010","journal-title":"Proc IEEE ICECS"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2285403"},{"key":"ref2","first-page":"18.7.1","author":"perniola","year":"2012","journal-title":"IEDM Tech Dig"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2090157"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"2201","DOI":"10.1109\/JPROC.2010.2070050","volume":"98","author":"wong","year":"2010","journal-title":"Proceedings of the IEEE"}],"event":{"name":"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)","start":{"date-parts":[[2014,12,7]]},"location":"Marseille, France","end":{"date-parts":[[2014,12,10]]}},"container-title":["2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7041007\/7049902\/07050027.pdf?arnumber=7050027","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T06:37:50Z","timestamp":1498199870000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7050027\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,12]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/icecs.2014.7050027","relation":{},"subject":[],"published":{"date-parts":[[2014,12]]}}}