{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T21:04:31Z","timestamp":1729631071935,"version":"3.28.0"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,12]]},"DOI":"10.1109\/icecs.2014.7050041","type":"proceedings-article","created":{"date-parts":[[2015,3,3]],"date-time":"2015-03-03T20:03:03Z","timestamp":1425412983000},"page":"538-541","source":"Crossref","is-referenced-by-count":2,"title":["Closed-loop simulation method for evaluation of static offset in discrete-time comparators"],"prefix":"10.1109","author":[{"given":"A. J.","family":"Gines","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Peralias","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Leger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Rueda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1975.4314462"},{"key":"ref3","first-page":"1241","article-title":"IEEE standard for terminology and test methods for analog-to-digital converters","year":"2001","journal-title":"IEEE standards"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2005.1594475"},{"article-title":"A Methodology for the Offset-Simulation of Comparators","year":"0","author":"graupner","key":"ref5"},{"key":"ref7","article-title":"An 8-bit 0.35-V 5.04-fJ\/Conversion-Step SAR ADC With Background Self-Calibration of Comparator Offset","author":"rabuske","year":"2014","journal-title":"IEEE Trans on Very Large Scale Integration (VLSI) Sys"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2335233"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"911","DOI":"10.1109\/TCSI.2009.2015207","article-title":"Analyses of Static and Dynamic Random Offset Voltages in Dynamic Comparators","volume":"56","author":"he","year":"2009","journal-title":"IEEE Tran on Circuits and Systems I"}],"event":{"name":"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)","start":{"date-parts":[[2014,12,7]]},"location":"Marseille, France","end":{"date-parts":[[2014,12,10]]}},"container-title":["2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7041007\/7049902\/07050041.pdf?arnumber=7050041","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T06:37:49Z","timestamp":1498199869000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7050041\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,12]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/icecs.2014.7050041","relation":{},"subject":[],"published":{"date-parts":[[2014,12]]}}}