{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,30]],"date-time":"2025-10-30T22:32:28Z","timestamp":1761863548299,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,12]]},"DOI":"10.1109\/icecs.2015.7440342","type":"proceedings-article","created":{"date-parts":[[2016,3,29]],"date-time":"2016-03-29T20:53:22Z","timestamp":1459284802000},"page":"437-441","source":"Crossref","is-referenced-by-count":6,"title":["Signature multi-mode hardware-based self-test architecture for digital integrated circuits"],"prefix":"10.1109","author":[{"given":"Mohamed H.","family":"El-Mahlawy","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"237","DOI":"10.1049\/iet-cdt:20060137","article-title":"march ab, a state-of-the-art march test for realistic static linked faults and dynamic faults in srams","volume":"1","author":"bosio","year":"2007","journal-title":"IET Computers&Digital Techniques"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/AQTR.2008.4588712"},{"key":"ref12","article-title":"A Novel Microcomputer Based Digital Automatic Testing Equipment using Signature Analysis","author":"el","year":"1996","journal-title":"IEEE conference on Industrial Applications in Power Systems Computer Science and Telecommunications"},{"key":"ref13","doi-asserted-by":"crossref","DOI":"10.21608\/asat.2007.23967","article-title":"Design and Implementation of New Automatic Testing System For Digital Circuits Based on The Signature Analysis","author":"el-mahlawy","year":"2007","journal-title":"The 7 international conference on Aerospace Sciences & Aviation Technology Military Technical College"},{"key":"ref14","doi-asserted-by":"crossref","DOI":"10.21608\/iceeng.2008.34333","article-title":"FPGA Implementation of the Portable Automatic Testing System for Digital Circuits","author":"el-mahlawy","year":"2008","journal-title":"Proceedings of the 6th International Conference of the Electrical Engineering ICEENG-6 Military Technical College"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/43.3132"},{"key":"ref4","first-page":"16","article-title":"New Automatic Testing Architecture For Integrated Circuits","author":"sherif","year":"2006","journal-title":"5th International Conference of the Electrical Engineering ICEENG-5 Military Technical College"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/0471457787"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-5597-1"},{"article-title":"Design for testability of VLSI Circuits","year":"2008","author":"eldeen","key":"ref5"},{"key":"ref8","first-page":"95","article-title":"March SS: A Test for All Static Simple RAM Faults","author":"said","year":"2002","journal-title":"Proceedings of the IEEE International Workshop on Memory Technology Design and Testing"},{"article-title":"Arithmetic Built-In Self-Test for Embedded Systems","year":"1998","author":"rajski","key":"ref7"},{"key":"ref2","article-title":"In-Circuit Testing for Electronic Board","author":"mohamed","year":"2006","journal-title":"ICEENG Military Technical College"},{"article-title":"Pseudo-Exhaustive Built-In Self-Test for Boundary Scan","year":"2000","author":"el-mahlawy","key":"ref1"},{"key":"ref9","article-title":"March ABl: New March Tests for Unlinked Dynamic Memory Faults","author":"benso","year":"2005","journal-title":"IEEE International Test Conference"}],"event":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","start":{"date-parts":[[2015,12,6]]},"location":"Cairo, Egypt","end":{"date-parts":[[2015,12,9]]}},"container-title":["2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7430153\/7440163\/07440342.pdf?arnumber=7440342","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,17]],"date-time":"2023-08-17T07:37:39Z","timestamp":1692257859000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7440342\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/icecs.2015.7440342","relation":{},"subject":[],"published":{"date-parts":[[2015,12]]}}}